High‐field mobility of light holes in strained quantum wells

1989 ◽  
Vol 54 (22) ◽  
pp. 2215-2217 ◽  
Author(s):  
Harold P. Hjalmarson
1989 ◽  
Vol 32 (12) ◽  
pp. 1777-1780 ◽  
Author(s):  
Harold P. Hjalmarson ◽  
I.J. Fritz ◽  
L.R. Dawson

2011 ◽  
Vol 55 (1) ◽  
pp. 64-67 ◽  
Author(s):  
W.B. Chen ◽  
C.H. Cheng ◽  
C.W. Lin ◽  
P.C. Chen ◽  
Albert Chin

1993 ◽  
Vol 297 ◽  
Author(s):  
Qing Gu ◽  
Eric A. Schiff ◽  
Jean Baptiste Chevrier ◽  
Bernard Equer

We have measured the electron drift mobility in a-Si:H at high electric fields (E ≤ 3.6 x 105 V%cm). The a-Si:Hpin structure was prepared at Palaiseau, and incorporated a thickp+ layer to retard high field breakdown. The drift mobility was obtained from transient photocurrent measurements from 1 ns - 1 ms following a laser pulse. Mobility increases as large as a factor of 30 were observed; at 77 K the high field mobility de¬pended exponentially upon field (exp(E/Eu), where E u= 1.1 x 105 V%cm). The same field dependence was observed in the time range 10 ns – 1 μs, indicating that the dispersion parameter change with field was negligible. This latter result appears to exclude hopping in the exponential conduction bandtail as the fundamental transport mechanism in a-Si:H above 77 K; alternate models are briefly discussed.


2001 ◽  
Vol 79 (10) ◽  
pp. 1483-1485 ◽  
Author(s):  
S. P. Łepkowski ◽  
H. Teisseyre ◽  
T. Suski ◽  
P. Perlin ◽  
N. Grandjean ◽  
...  

2006 ◽  
Vol 27 (3) ◽  
pp. 185-187 ◽  
Author(s):  
Zhibo Zhang ◽  
S.C. Song ◽  
M.A. Quevedo-Lopez ◽  
Kisik Choi ◽  
P. Kirsch ◽  
...  
Keyword(s):  
High K ◽  

1990 ◽  
Vol 5 (6) ◽  
pp. 628-630 ◽  
Author(s):  
M Reddy ◽  
R Grey ◽  
P A Claxton ◽  
J Woodhead

1999 ◽  
Vol 33 (9) ◽  
pp. 1007-1009
Author(s):  
Z. N. Sokolova ◽  
D. A. Vinokurov ◽  
I. S. Tarasov ◽  
N. A. Gun’ko ◽  
G. G. Zegrya

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