INVESTIGATIONS OF SUPERCONDUCTING AND NON-SUPERCONDUCTING YBa2 Cu3 O7-x BY FIELD ION MICROSCOPY, ATOM-PROBE MASS SPECTROSCOPY AND FIELD ELECTRON EMISSION

G. L. KELLOGG; S. S. BRENNER

doi:10.1051/jphyscol:1988679

INVESTIGATIONS OF SUPERCONDUCTING AND NON-SUPERCONDUCTING YBa2 Cu3 O7-x BY FIELD ION MICROSCOPY, ATOM-PROBE MASS SPECTROSCOPY AND FIELD ELECTRON EMISSION

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1988679 ◽

1988 ◽

Vol 49 (C6) ◽

pp. C6-465-C6-470 ◽

Cited By ~ 3

Author(s):

G. L. KELLOGG ◽

S. S. BRENNER

Keyword(s):

Mass Spectroscopy ◽

Electron Emission ◽

Atom Probe ◽

Field Electron Emission ◽

Field Ion Microscopy ◽

Field Electron ◽

Ion Microscopy

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Field ion microscopy and pulsed laser atom-probe mass spectroscopy of insulating glasses

Vacuum ◽

10.1016/0042-207x(85)90294-5 ◽

1985 ◽

Vol 35 (8) ◽

pp. 345

Keyword(s):

Mass Spectroscopy ◽

Pulsed Laser ◽

Atom Probe ◽

Field Ion Microscopy ◽

Ion Microscopy

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Study on titanium carbide field emitters by field-ion microscopy, field-electron emission microscopy, auger electron spectroscopy, and atom-probe field-ion microscopy

Surface Science Letters ◽

10.1016/0167-2584(82)90422-4 ◽

1982 ◽

Vol 120 (1) ◽

pp. A329

Author(s):

M. Futamoto ◽

I. Yuito ◽

U. Kawabe ◽

O. Nishikawa ◽

Y. Tsunashima ◽

...

Keyword(s):

Titanium Carbide ◽

Electron Emission ◽

Electron Spectroscopy ◽

Auger Electron ◽

Atom Probe ◽

Probe Field ◽

Field Ion Microscopy ◽

Field Emitters ◽

Emission Microscopy ◽

Ion Microscopy

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Field ion microscopy and imaging atom‐probe mass spectroscopy of superconducting YBa2Cu3O7−x

Applied Physics Letters ◽

10.1063/1.98491 ◽

1987 ◽

Vol 51 (22) ◽

pp. 1851-1853 ◽

Cited By ~ 25

Author(s):

G. L. Kellogg ◽

S. S. Brenner

Keyword(s):

Mass Spectroscopy ◽

Atom Probe ◽

Field Ion Microscopy ◽

Ion Microscopy ◽

Imaging Atom Probe ◽

Microscopy And Imaging

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COMBINED FIELD ION AND FIELD ELECTRON EMISSION MICROSCOPY AND ENERGY-RESOLVED ATOM-PROBE SPECTROSCOPY OF Y Ba2 Cu3 O7-x

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1988677 ◽

1988 ◽

Vol 49 (C6) ◽

pp. C6-453-C6-458

Author(s):

N. ERNST ◽

G. BOZDECH ◽

A. J. MELMED

Keyword(s):

Electron Emission ◽

Atom Probe ◽

Field Electron Emission ◽

Field Electron ◽

Emission Microscopy ◽

Probe Spectroscopy

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Field-ion microscopy and atom-probe mass spectroscopy of sulfur on the (111) plane of nickel

Surface Science Letters ◽

10.1016/0167-2584(84)90688-1 ◽

1984 ◽

Vol 147 (1) ◽

pp. A448

Author(s):

J. Hren ◽

G.L. Kellogg

Keyword(s):

Mass Spectroscopy ◽

Atom Probe ◽

Field Ion Microscopy ◽

Ion Microscopy

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Field ion microscopy and pulsed laser atom‐probe mass spectroscopy of insulating glasses

Journal of Applied Physics ◽

10.1063/1.331509 ◽

1982 ◽

Vol 53 (9) ◽

pp. 6383-6386 ◽

Cited By ~ 28

Author(s):

G. L. Kellogg

Keyword(s):

Mass Spectroscopy ◽

Pulsed Laser ◽

Atom Probe ◽

Field Ion Microscopy ◽

Ion Microscopy

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Study on titanium carbide field emitters by field-ion microscopy, field-electron emission microscopy, Auger electron spectroscopy, and atom-probe field-ion microscopy

Surface Science ◽

10.1016/0039-6028(82)90276-x ◽

1982 ◽

Vol 120 (1) ◽

pp. 90-102 ◽

Cited By ~ 7

Author(s):

M. Futamoto ◽

I. Yuito ◽

U. Kawabe ◽

O. Nishikawa ◽

Y. Tsunashima ◽

...

Keyword(s):

Titanium Carbide ◽

Electron Emission ◽

Electron Spectroscopy ◽

Auger Electron ◽

Atom Probe ◽

Probe Field ◽

Field Ion Microscopy ◽

Field Emitters ◽

Emission Microscopy ◽

Ion Microscopy

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Field electron emission, the atom probe and scanning tunneling spectroscopy

Ultramicroscopy ◽

10.1016/0304-3991(88)90309-9 ◽

1988 ◽

Vol 24 (2-3) ◽

pp. 169-179 ◽

Cited By ~ 2

Author(s):

J.J. Hren ◽

G. Shedd

Keyword(s):

Electron Emission ◽

Atom Probe ◽

Scanning Tunneling Spectroscopy ◽

Tunneling Spectroscopy ◽

Field Electron Emission ◽

Scanning Tunneling ◽

Field Electron

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Field-ion microscopy and atom-probe mass spectroscopy of sulfur on the (111) plane of nickel

Surface Science Letters ◽

10.1016/0167-2584(84)90844-2 ◽

1984 ◽

Vol 147 (2-3) ◽

pp. A448

Author(s):

J. Hren ◽

G.L. Kellogg

Keyword(s):

Mass Spectroscopy ◽

Atom Probe ◽

Field Ion Microscopy ◽

Ion Microscopy

Download Full-text

Field-ion microscopy and atom-probe mass spectroscopy of sulfur on the (111) plane of nickel

Surface Science ◽

10.1016/0039-6028(84)90457-6 ◽

1984 ◽

Vol 147 (2-3) ◽

pp. 349-355 ◽

Cited By ~ 7

Author(s):

J. Hren ◽

G.L. Kellogg

Keyword(s):

Mass Spectroscopy ◽

Atom Probe ◽

Field Ion Microscopy ◽

Ion Microscopy

Download Full-text