High field magnetoresistance of silver containing rare-earth impurities

1979 ◽  
Vol 40 (C5) ◽  
pp. C5-40-C5-41
Author(s):  
J. C. Ousset ◽  
G. Creuzet ◽  
A. Fert
1992 ◽  
Vol 262 ◽  
Author(s):  
Marek Godlewski

ABSTRACTIn this paper we analyze processes which may improve the efficiency of low- and high- field electroluminescence devices based on rare earth doped II-VI and III-V semiconductors. The main topicsare the processes which follow impact ionization, i.e., carrier trapping and/or exciton binding. Excitonic excitation mechanism is shown to occur also for ions which are not directly ionized, as observed recently for some rare earth impurities in II-VI and III-V semiconductors.


1981 ◽  
Vol 24 (1) ◽  
pp. 7-22 ◽  
Author(s):  
J.C. Ousset ◽  
G. Carrere ◽  
J.P. Ulmet ◽  
S. Askenazy ◽  
G. Creuzet ◽  
...  

Author(s):  
T. F. Kelly ◽  
P. J. Lee ◽  
E. E. Hellstrom ◽  
D. C. Larbalestier

Recently there has been much excitement over a new class of high Tc (>30 K) ceramic superconductors of the form A1-xBxCuO4-x, where A is a rare earth and B is from Group II. Unfortunately these materials have only been able to support small transport current densities 1-10 A/cm2. It is very desirable to increase these values by 2 to 3 orders of magnitude for useful high field applications. The reason for these small transport currents is as yet unknown. Evidence has, however, been presented for superconducting clusters on a 50-100 nm scale and on a 1-3 μm scale. We therefore planned a detailed TEM and STEM microanalysis study in order to see whether any evidence for the clusters could be seen.A La1.8Sr0.2Cu04 pellet was cut into 1 mm thick slices from which 3 mm discs were cut. The discs were subsequently mechanically ground to 100 μm total thickness and dimpled to 20 μm thickness at the center.


1968 ◽  
Vol 39 (2) ◽  
pp. 1243-1243
Author(s):  
C. W. Chen ◽  
L. Roger Edwards ◽  
Sam Legvold

1978 ◽  
Vol 25 (8) ◽  
pp. 543-546 ◽  
Author(s):  
C. Rettori ◽  
D. Davidov ◽  
J. Suassuna ◽  
G.E. Barberis ◽  
B. Elschner ◽  
...  

Author(s):  
Bagai-ool Yu. Saryg-ool ◽  
Lidiya N. Bukreeva ◽  
Irina N. Myagkaya ◽  
Aleksandr V. Tolstov ◽  
Elena V. Lazareva ◽  
...  

Influence of sample pretreatment on the analysis of the high contents of rare earth (REE) and high field strength (HFSE) elements in geological samples by inductively coupled plasma atomic emission spectrometry (ICP-AES) and inductively coupled plasma mass spectrometry (ICP-MS) was studied. The rocks and rich ores of the Tomtor Nb-REE deposit were explored. Complete dissolution of the geological samples with a high content of “refractory” minerals has been achieved using fusion with a sodium peroxide. The results obtained by ICP-AES and ICP-MS after chemical dissolution are comparable with the results obtained by the XRF-SR without chemical pretreatment


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