(Photo)pyroelectric method and device with modulated Peltier element for thermophysical characterization of materials

2005 ◽  
Vol 125 ◽  
pp. 661-663
Author(s):  
M. Chirtoc ◽  
F. Brizion ◽  
I. Chirtoc
Keyword(s):  
Peltier Element ◽  
Characterization Of Materials ◽  
Thermophysical Characterization

Photopyroelectric Calorimeter for Phase Transitions Monitoring: Application to Chocolate

2009 ◽  
Vol 1242 ◽  
Author(s):  
E. I. Martínez-Ordoñez ◽  
E. Marín ◽  
J. A. I. Díaz-Góngora ◽  
A. Calderón
Keyword(s):  
Differential Scanning Calorimetry ◽  
Thermal Properties ◽  
Phase Transitions ◽  
Materials Science ◽  
Scanning Calorimetry ◽  
Characterization Of Materials ◽  
Thermophysical Characterization ◽  
Monitoring Application ◽  
Differential Scanning Calorimetry Technique

ABSTRACTIn this work we report about the design and construction of a simple and cheap calorimeter for phase transitions monitoring using Peltier elements and based in the well known inverse (front) photopyroelectric method for thermophysical characterization of materials. We describe its application for the detection of phase transitions in chocolate samples, as an alternative, for example, to the most widely used and more expensive Differential Scanning Calorimetry technique. The manufacture of chocolate requires an understanding of the chemistry and the physical properties of the product. Thus the involved problems during the confection process are those of the so-called materials science. Among them, those related with tempering are of particular importance. Because the fats in cocoa butter experience the so-called polymorphous crystallization, the primary purpose of tempering is to assure that only the best form is present in the final product. One way to characterize this is by measurement of the temperature dependence of the thermal properties of the chocolate and the monitoring of the temperature at which phase transitions take place. We show that the photopyroelectric method, aided with Peltier cells temperature control, can be a useful choice for this purpose.

Some applications of electron beam microanalysis techniques in VLSI process evaluation

1983 ◽  
Vol 41 ◽  
pp. 160-161
Author(s):  
Simon Thomas
Keyword(s):  
Integrated Circuits ◽  
Process Evaluation ◽  
Large Scale ◽  
Technology Development ◽  
Analytical Techniques ◽  
Successful Implementation ◽  
Analysis Of Failures ◽  
Characterization Of Materials ◽  
Circuits Vlsi

Trends in the technology development of very large scale integrated circuits (VLSI) have been in the direction of higher density of components with smaller dimensions. The scaling down of device dimensions has been not only laterally but also in depth. Such efforts in miniaturization bring with them new developments in materials and processing. Successful implementation of these efforts is, to a large extent, dependent on the proper understanding of the material properties, process technologies and reliability issues, through adequate analytical studies. The analytical instrumentation technology has, fortunately, kept pace with the basic requirements of devices with lateral dimensions in the micron/ submicron range and depths of the order of nonometers. Often, newer analytical techniques have emerged or the more conventional techniques have been adapted to meet the more stringent requirements. As such, a variety of analytical techniques are available today to aid an analyst in the efforts of VLSI process evaluation. Generally such analytical efforts are divided into the characterization of materials, evaluation of processing steps and the analysis of failures.

Applications of ultramicrotomy for materials characterization

1993 ◽  
Vol 51 ◽  
pp. 232-233
Author(s):  
R.T. Blackham ◽  
J.J. Haugh ◽  
C.W. Hughes ◽  
M.G. Burke
Keyword(s):  
Materials Science ◽  
Microstructural Analysis ◽  
Analytical Electron Microscopy ◽  
Austenitic Stainless Steels ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Thermally Induced ◽  
Radiation Induced ◽  
Characterization Of Materials

Essential to the characterization of materials using analytical electron microscopy (AEM) techniques is the specimen itself. Without suitable samples, detailed microstructural analysis is not possible. Ultramicrotomy, or diamond knife sectioning, is a well-known mechanical specimen preparation technique which has been gaining attention in the materials science area. Malis and co-workers and Glanvill have demonstrated the usefulness and applicability of this technique to the study of a wide variety of materials including Al alloys, composites, and semiconductors. Ultramicrotomed specimens have uniform thickness with relatively large electron-transparent areas which are suitable for AEM anaysis.Interface Analysis in Type 316 Austenitic Stainless Steel: STEM-EDS microanalysis of grain boundaries in austenitic stainless steels provides important information concerning the development of Cr-depleted zones which accompany M23C6 precipitation, and documentation of radiation induced segregation (RIS). Conventional methods of TEM sample preparation are suitable for the evaluation of thermally induced segregation, but neutron irradiated samples present a variety of problems in both the preparation and in the AEM analysis, in addition to the handling hazard.

Free-Space Electromagnetic Characterization of Materials for Microwave and Radar Applications

PIERS Online ◽  
2005 ◽  
Vol 1 (2) ◽  
pp. 128-132 ◽  
Author(s):  
Habiba Hafdallah Ouslimani ◽  
Redha Abdeddaim ◽  
Alain Priou
Keyword(s):  
Free Space ◽  
Radar Applications ◽  
Characterization Of Materials

scholarly journals Vocabulary of radioanalytical methods (IUPAC Recommendations 2020)

2020 ◽  
Vol 0 (0) ◽  
Author(s):  
Zhifang Chai ◽  
Amares Chatt ◽  
Peter Bode ◽  
Jan Kučera ◽  
Robert Greenberg ◽  
...  
Keyword(s):  
Nuclear Reactions ◽  
Hyperfine Interactions ◽  
Chemical Species ◽  
Radiation Detectors ◽  
Nuclear Analysis ◽  
Characterization Of Materials ◽  
Nuclear Effects ◽  
Nuclear Processes ◽  
Radioanalytical Methods

AbstractThese recommendations are a vocabulary of basic radioanalytical terms which are relevant to radioanalysis, nuclear analysis and related techniques. Radioanalytical methods consider all nuclear-related techniques for the characterization of materials where ‘characterization’ refers to compositional (in terms of the identity and quantity of specified elements, nuclides, and their chemical species) and structural (in terms of location, dislocation, etc. of specified elements, nuclides, and their species) analyses, involving nuclear processes (nuclear reactions, nuclear radiations, etc.), nuclear techniques (reactors, accelerators, radiation detectors, etc.), and nuclear effects (hyperfine interactions, etc.). In the present compilation, basic radioanalytical terms are included which are relevant to radioanalysis, nuclear analysis and related techniques.

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