Fatigue in Cu-Zn-Al single crystals during pseudoelastic cycling: In situ observations by SEM and optical microscopy

2003 ◽  
Vol 112 ◽  
pp. 623-626 ◽  
Author(s):  
C. Damiani ◽  
M. Sade ◽  
F. C. Lovey
Keyword(s):  
Optical Microscopy ◽  
Single Crystals ◽  
In Situ Observations

In situ observations of indentation damage in single crystals of MgO

Wear ◽  
1999 ◽  
Vol 233-235 ◽  
pp. 717-726 ◽  
Author(s):  
M.Munawar Chaudhri ◽  
Yuji Enomoto
Keyword(s):  
Single Crystals ◽  
In Situ Observations ◽  
Indentation Damage

In situ observations of crystal growth of spherical Si single crystals

2007 ◽  
Vol 307 (2) ◽  
pp. 341-347 ◽  
Author(s):  
Xinming Huang ◽  
Satoshi Uda ◽  
Hideyoshi Tanabe ◽  
Nobuyuki Kitahara ◽  
Hisao Arimune ◽  
...  
Keyword(s):  
Crystal Growth ◽  
Single Crystals ◽  
In Situ Observations

In-situ observations of the behaviors of ferroelectric domains in BaTiO3 under applied electric fields with TEM

1992 ◽  
Vol 50 (1) ◽  
pp. 348-349
Author(s):  
Feng Tsai ◽  
Victoria Khiznichenko ◽  
J. M. Cowley
Keyword(s):  
Optical Microscopy ◽  
Electric Fields ◽  
Ferroelectric Materials ◽  
In Situ Tem ◽  
Bulk Crystals ◽  
Large Bulk ◽  
Ferroelectric Domains ◽  
In Situ Observations ◽  
New Interpretation

The previous studies on the behaviors of ferroelectric domains under applied electric fields were made by a number of researchers, e.g. Merz and Little on bulk BaTiO3 crystals with optical microscopy. It was suggested that under the applied electric field the new antiparallel domains nucleated and grew and 90° and 180° domains nucleated and grew sidewise. However, those results and conclusions were obtained from the experiments on large bulk crystals with optical microscopy of relatively lower magnification and resolution. TEM is a very powerful tool in the study of crystal structure and defects and may provide a new interpretation to the study of microdomains of hundred angstroms in thin ferroelectric films with a higher magnification and resolution and may be combined with electron diffraction. However, no reference has been found that an in-situ TEM study of the behaviors of ferroelectric materials under applied electric fields has ever been made.

In situ observations of electromigration induced void behavior

1995 ◽  
Vol 53 ◽  
pp. 244-245
Author(s):  
T. Marieb ◽  
J. C. Bravman ◽  
P. Flinn ◽  
D. Gardner ◽  
M. Madden
Keyword(s):  
Electron Microscopy ◽  
Void Nucleation ◽  
Plan View ◽  
Transmission Electron ◽  
Nucleation Sites ◽  
Microelectronics Industry ◽  
In Situ Observations ◽  
Backscatter Electron Detector ◽  
Voltage Scanning

Electromigration and stress voiding have been active areas of research in the microelectronics industry for many years. While accelerated testing of these phenomena has been performed for the last 25 years[1-2], only recently has the introduction of high voltage scanning electron microscopy (HVSEM) made possible in situ testing of realistic, passivated, full thickness samples at high resolution.With a combination of in situ HVSEM and post-testing transmission electron microscopy (TEM) , electromigration void nucleation sites in both normal polycrystalline and near-bamboo pure Al were investigated. The effect of the microstructure of the lines on the void motion was also studied.The HVSEM used was a slightly modified JEOL 1200 EX II scanning TEM with a backscatter electron detector placed above the sample[3]. To observe electromigration in situ the sample was heated and the line had current supplied to it to accelerate the voiding process. After testing lines were prepared for TEM by employing the plan-view wedge technique [6].

scholarly journals In situ observations of coral spawning and spawn slick at Lankayan Island, Sabah, Malaysia

2021 ◽  
Vol 51 (1) ◽  
Author(s):  
Sze Hoon Gan ◽  
Zarinah Waheed ◽  
Fung Chen Chung ◽  
Davies Austin Spiji ◽  
Leony Sikim ◽  
...  
Keyword(s):  
Coral Spawning ◽  
In Situ Observations
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