Nanofabrication of diffractive optics for soft X-ray and atom beam focusing

2003 ◽  
Vol 104 ◽  
pp. 207-210 ◽  
Author(s):  
S. Rehbein
Keyword(s):  
Diffractive Optics ◽  
Atom Beam ◽  
X Ray ◽  
Beam Focusing

Dynamic X-ray lithography for blazed diffractive optics fabrication

2008 ◽  
Author(s):  
V. F. Pindyurin ◽  
B. G. Goldenberg ◽  
E. V. Petrova ◽  
U. V. Ancharova ◽  
V. S. Eliseev ◽  
...  
Keyword(s):  
Diffractive Optics ◽  
X Ray ◽  
Optics Fabrication

scholarly journals Pink-beam focusing with a one-dimensional compound refractive lens

2016 ◽  
Vol 23 (5) ◽  
pp. 1082-1086 ◽  
Author(s):  
Eric M. Dufresne ◽  
Robert W. Dunford ◽  
Elliot P. Kanter ◽  
Yuan Gao ◽  
Seoksu Moon ◽  
...  
Keyword(s):  
Power Density ◽  
Imaging System ◽  
X Rays ◽  
One Dimensional ◽  
X Ray ◽  
Beam Focusing ◽  
Insertion Device ◽  
Refractive Lens ◽  
Low Density Plasma ◽  
Photon Source

The performance of a cooled Be compound refractive lens (CRL) has been tested at the Advanced Photon Source (APS) to enable vertical focusing of the pink beam and permit the X-ray beam to spatially overlap with an 80 µm-high low-density plasma that simulates astrophysical environments. Focusing the fundamental harmonics of an insertion device white beam increases the APS power density; here, a power density as high as 500 W mm−2was calculated. A CRL is chromatic so it does not efficiently focus X-rays whose energies are above the fundamental. Only the fundamental of the undulator focuses at the experiment. A two-chopper system reduces the power density on the imaging system and lens by four orders of magnitude, enabling imaging of the focal plane without any X-ray filter. A method to measure such high power density as well as the performance of the lens in focusing the pink beam is reported.

Nanofabrication and diffractive optics for high-resolution x-ray applications

2000 ◽  
Vol 18 (6) ◽  
pp. 2970 ◽  
Author(s):  
Erik H. Anderson ◽  
Deirdre L. Olynick ◽  
Bruce Harteneck ◽  
Eugene Veklerov ◽  
Gregory Denbeaux ◽  
...  
Keyword(s):  
High Resolution ◽  
Diffractive Optics ◽  
X Ray

Systematic Errors in X-ray Diffractometer Stress Measurements Due to Specimen Geometry and Beam Divergence

1970 ◽  
Vol 14 ◽  
pp. 360-376 ◽  
Author(s):  
Harry Zantopulos ◽  
Chester F. Jatczak
Keyword(s):  
Tensile Stress ◽  
Systematic Errors ◽  
Beam Divergence ◽  
Convex Shape ◽  
Computer Data ◽  
X Ray ◽  
Stress Measurements ◽  
Beam Focusing ◽  
Horizontal Beam ◽  
Beam Geometry

AbstractA method is described for determining the magnitude and sense of systematic errors in x-ray diffractometer stress measurements produced by focusing aberrations during diffraction from imperfect specimen contours and wide horizontal beam divergences. Corrections for such systematic errors are presently not made. However, if the highest accuracy and/or absolute values of stress are desired, these must be either taken into account or minimized by control of beam geometry. Equations and computer data are presented to indicate the errors in 2θ and stress (σ) resulting from use of flat, various convex and concave curvatures for primary beam divergences of 1° to 3°, Stress errors are calculated for both the parafocus technique of beam focusing and the stationary or non-focusing method.The results show that convex and flat specimens always produce negative 2θ deviations from the condition of perfect focus and thus a net positive or tensile stress error. The magnitude of this error increases as the radius of the convex shape decreases and/or the ψangle and beam divergence is increased. Concave specimens with curvatures less than the radius of the concave shape required for perfect focus (see body of report) produce positive 2θ deviations and, therefore, negative or com-pressive stress errors.The stationary or non-focusing technique produced systematic errors which were 1/3 of those produced by focusing aberrations with the parafocus technique. Fortunately, in both cases the actual errors are not very large (less than ±7.5 ksi), even with divergent beams as large as 3° and convex radii as small as 125”.

scholarly journals Advanced X-ray diffractive optics

2009 ◽  
Vol 186 ◽  
pp. 012078 ◽  
Author(s):  
J Vila-Comamala ◽  
K Jefimovs ◽  
T Pilvi ◽  
M Ritala ◽  
S S Sarkar ◽  
...  
Keyword(s):  
Diffractive Optics ◽  
X Ray

scholarly journals Design and characterization of electron beam focusing for X-ray generation in novel medical imaging architecture

2014 ◽  
Vol 21 (5) ◽  
pp. 056702 ◽  
Author(s):  
V. Bogdan Neculaes ◽  
Yun Zou ◽  
Peter Zavodszky ◽  
Louis Inzinna ◽  
Xi Zhang ◽  
...  
Keyword(s):  
Electron Beam ◽  
Medical Imaging ◽  
X Ray ◽  
Beam Focusing

The adaptation of a Philips PW1050 X-ray diffractometer system to incorporate an incident beam focusing monochromator: Design, assembly and characterisation

1996 ◽  
Vol 11 (4) ◽  
pp. 290-296
Author(s):  
I. C. Madsen ◽  
R. J. Hill ◽  
G. Stereff
Keyword(s):  
High Resolution ◽  
Incident Beam ◽  
Base Plate ◽  
Knife Edge ◽  
Beam Path ◽  
X Ray ◽  
Beam Focusing ◽  
Horizontal Beam ◽  
Structure Solution ◽  
Resolution Single

A conventional vertical powder diffractometer has been adapted to allow the collection of high-resolution, single-wavelength diffraction data using Co, Cu or Mo radiation. The major modifications are (i) incorporation of an incident beam focusing monochromator attached to the tube shield, (ii) a variable tilt angle of the tube shield to provide a horizontal beam path through the diffractometer (for ease of alignment), (iii) mounting of the entire diffractometer on a single, very stable base-plate, with micrometer-controlled adjustment of the orientation, (iv) inclusion of a knife-edge, micrometer-controlled focusing slit, and (v) use of a range of Soller slits with acceptance angles down to 1.5° 2φ. The performance of the instrument compares favourably with conventional non-monochromated diffractometer data collected from SRM660 LaB6 and monoclinic ZrO2. In particular, the peaks are more symmetric and have narrower widths, and the peak-to-background ratio is much higher, leading to much superior resolution and profile shapes for structure solution and Rietveld refinement.

scholarly journals Takagi-Taupin description of x-ray dynamical diffraction from diffractive optics with large numerical aperture

2007 ◽  
Vol 76 (11) ◽  
Author(s):  
Hanfei Yan ◽  
Jörg Maser ◽  
Albert Macrander ◽  
Qun Shen ◽  
Stefan Vogt ◽  
...  
Keyword(s):  
Numerical Aperture ◽  
Diffractive Optics ◽  
Dynamical Diffraction ◽  
X Ray

Nanostructuring of zone plates for helium atom beam focusing

2000 ◽  
Vol 53 (1-4) ◽  
pp. 685-688 ◽  
Author(s):  
S. Rehbein ◽  
R.B. Doak ◽  
R.E. Grisenti ◽  
G. Schmahl ◽  
J.P. Toennies ◽  
...  
Keyword(s):  
Helium Atom ◽  
Atom Beam ◽  
Beam Focusing ◽  
Zone Plates
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