Design and fabrication of new optics for X-ray microscopy and material science

2003 ◽  
Vol 104 ◽  
pp. 177-183 ◽  
Keyword(s):  
Material Science ◽  
X Ray

A 36-Pixel Tunnel Junction Soft X-Ray Spectrometer for Scintillator Material Science

2007 ◽  
Vol 17 (2) ◽  
pp. 351-354 ◽  
Author(s):  
S. Friedrich ◽  
O.B. Drury ◽  
Shaopang Yuan ◽  
P. Szupryczynski ◽  
M.A. Spurrier ◽  
...  
Keyword(s):  
Tunnel Junction ◽  
Material Science ◽  
X Ray ◽  
Scintillator Material

scholarly journals Design and performance of an X-ray scanning microscope at the Hard X-ray Nanoprobe beamline of NSLS-II

2017 ◽  
Vol 24 (6) ◽  
pp. 1113-1119 ◽  
Author(s):  
E. Nazaretski ◽  
H. Yan ◽  
K. Lauer ◽  
N. Bouet ◽  
X. Huang ◽  
...  
Keyword(s):  
Material Science ◽  
Phase Contrast ◽  
Heat Dissipation ◽  
Regulation System ◽  
Scanning Microscope ◽  
National Synchrotron Light Source ◽  
X Ray ◽  
Synchrotron Light ◽  
Differential Phase Contrast ◽  
And Performance

A hard X-ray scanning microscope installed at the Hard X-ray Nanoprobe beamline of the National Synchrotron Light Source II has been designed, constructed and commissioned. The microscope relies on a compact, high stiffness, low heat dissipation approach and utilizes two types of nanofocusing optics. It is capable of imaging with ∼15 nm × 15 nm spatial resolution using multilayer Laue lenses and 25 nm × 26 nm resolution using zone plates. Fluorescence, diffraction, absorption, differential phase contrast, ptychography and tomography are available as experimental techniques. The microscope is also equipped with a temperature regulation system which allows the temperature of a sample to be varied in the range between 90 K and 1000 K. The constructed instrument is open for general users and offers its capabilities to the material science, battery research and bioscience communities.

scholarly journals Nanoimaging using soft X-ray and EUV laser-plasma sources

2018 ◽  
Vol 167 ◽  
pp. 03001 ◽  
Author(s):  
Przemyslaw Wachulak ◽  
Alfio Torrisi ◽  
Mesfin Ayele ◽  
Andrzej Bartnik ◽  
Joanna Czwartos ◽  
...  
Keyword(s):  
Laser Plasma ◽  
Material Science ◽  
Imaging Systems ◽  
Fibroblast Cells ◽  
Plasma Sources ◽  
Full Field ◽  
X Ray ◽  
Water Window ◽  
Imaging Results ◽  
New Research

In this work we present three experimental, compact desk-top imaging systems: SXR and EUV full field microscopes and the SXR contact microscope. The systems are based on laser-plasma EUV and SXR sources based on a double stream gas puff target. The EUV and SXR full field microscopes, operating at 13.8 nm and 2.88 nm wavelengths are capable of imaging nanostructures with a sub-50 nm spatial resolution and short (seconds) exposure times. The SXR contact microscope operates in the “water-window” spectral range and produces an imprint of the internal structure of the imaged sample in a thin layer of SXR sensitive photoresist. Applications of such desk-top EUV and SXR microscopes, mostly for biological samples (CT26 fibroblast cells and Keratinocytes) are also presented. Details about the sources, the microscopes as well as the imaging results for various objects will be presented and discussed. The development of such compact imaging systems may be important to the new research related to biological, material science and nanotechnology applications.

X-ray beam line at the NSLS for X-ray absorption studies in material science

1983 ◽  
Vol 208 (1-3) ◽  
pp. 631-635 ◽  
Author(s):  
Dale E. Sayers ◽  
Steve M. Heald ◽  
Michael A. Pick ◽  
Joseph I. Budnick ◽  
Edward A. Stern ◽  
...  
Keyword(s):  
Material Science ◽  
Beam Line ◽  
X Ray ◽  
Absorption Studies ◽  
X Ray Absorption

scholarly journals Hard X-ray In-situ Full-field Microscopy for Material Science Applications.

2018 ◽  
Vol 24 (S2) ◽  
pp. 552-553 ◽  
Author(s):  
Irina Snigireva ◽  
Ken Vidar Falch ◽  
Daniele Casari ◽  
Marco Di Michiel ◽  
Carsten Detlefs ◽  
...  
Keyword(s):  
Material Science ◽  
Full Field ◽  
X Ray

Introduction to X-Ray Absorption Spectroscopy and Its Applications in Material Science

2018 ◽  
pp. 497-548 ◽  
Author(s):  
Aditya Sharma ◽  
Jitendra Pal Singh ◽  
Sung Ok Won ◽  
Keun Hwa Chae ◽  
Surender Kumar Sharma ◽  
...  
Keyword(s):  
Absorption Spectroscopy ◽  
Material Science ◽  
X Ray ◽  
X Ray Absorption

scholarly journals Challenges in Rietveld Refinement and Structure Visualization in Ceramics

2021 ◽  
Author(s):  
Touseef Ahmad Para ◽  
Shaibal Kanti Sarkar
Keyword(s):  
Open Access ◽  
Diffraction Pattern ◽  
Rietveld Refinement ◽  
Material Properties ◽  
Material Science ◽  
Research Report ◽  
X Ray Diffraction ◽  
X Ray ◽  
Study Material ◽  
Core Concepts

The most common and basic characterization in the field of material science is the almighty X-ray diffraction (XRD). In every institute, every research report and every manuscript, concerning material properties, the X-ray diffraction pattern is essentially found. Although the basis of these works relies on the fact that X-ray diffraction pattern was found to be matching with some structure in a database, the in depth significance of the various characteristic diffraction manifestations of various physical characters are rarely discussed. Most of the researchers (especially beginners) are either not aware of the prowess of X-ray based characterizations, or have not been introduced to it properly or may be sometimes they are not interested in its results at all. The decreased interest (later) in the results from such studies might be for not being productive enough for time spending or non-effectiveness in justifying the motivation of the work. The former two are more related to the availability and accessibility of study material for the development of core concepts. Most of the institutes always do not have access to the span-wide scientific literature and the researchers joining these institutions are partly affected. In this context the effective open-access and free availability of intech-open, it is prudent to at least attempt to accumulate, assimilated and aggregate the concepts related to X-ray diffraction in a single package. The chapter is an attempt in the path of this route.

scholarly journals Studies on Ion-Exchange Properties of Polyaniline Zr(IV) Tungstoiodophosphate Nanocomposite Ion Exchanger

2013 ◽  
Vol 2013 ◽  
pp. 1-12 ◽  
Author(s):  
K. Jacinth Mispa ◽  
P. Subramaniam ◽  
R. Murugesan
Keyword(s):  
Ion Exchange ◽  
Material Science ◽  
Sol Gel ◽  
Ion Exchanger ◽  
X Ray Diffraction ◽  
X Ray ◽  
Antimicrobial Studies ◽  
Visible Spectra ◽  
Exchange Behaviour ◽  
Exchange Properties

Organic-inorganic hybrid materials prepared by sol-gel approach have attracted a great deal of attention in material science. Organic polymeric part of the composite provides mechanical and chemical stability whereas the inorganic part supports the ion-exchange behaviour and thermal stability and also increases the electrical conductivity. Such modified composite materials can be applied as an electrochemically switchable ion exchanger for water treatment, especially water softening. Polyaniline zirconium(IV) tungstoiodophosphate nanocomposite ion exchanger is prepared by sol-gel method. Polyaniline zirconium(IV) tungstoiodophosphate nanocomposite ion exchanger is synthesized and characterized by Fourier transform-infrared spectra, ultraviolet-visible spectra, X-ray diffraction, scanning electron microscopy, thermogravimetric analysis, ion exchange, conductivity, and antimicrobial studies. A mechanism for the formation of the polyaniline zirconium(IV) tungstoiodophosphate nanocomposite ion exchanger was discussed. The route reported here may be used for the preparation of other nanocomposite ion exchangers.

In situ hard X-ray transmission microscopy for material science

2016 ◽  
Vol 52 (6) ◽  
pp. 3497-3507 ◽  
Author(s):  
Ken Vidar Falch ◽  
Daniele Casari ◽  
Marco Di Michiel ◽  
Carsten Detlefs ◽  
Anatoly Snigireva ◽  
...  
Keyword(s):  
Material Science ◽  
Transmission Microscopy ◽  
X Ray
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