Nanoscale domain switching and 3-dimensional mapping of ferroelectric domains by scanning force microscopy

1998 ◽  
Vol 08 (PR9) ◽  
pp. Pr9-201-Pr9-204 ◽  
Author(s):  
L. M. Eng ◽  
M. Abplanalp ◽  
P. Günter ◽  
H.-J. Güntherodt
Keyword(s):  
Domain Switching ◽  
Scanning Force Microscopy ◽  
3 Dimensional ◽  
Force Microscopy ◽  
Ferroelectric Domains ◽  
Scanning Force ◽  
Dimensional Mapping

Characterization of self-assembling isolated ferroelectric domains by scanning force microscopy

2004 ◽  
Vol 100 (3-4) ◽  
pp. 339-346 ◽  
Author(s):  
Bongki Lee ◽  
Changdeuck Bae ◽  
Seung-Hyun Kim ◽  
Hyunjung Shin
Keyword(s):  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Self Assembling ◽  
Ferroelectric Domains ◽  
Scanning Force

Investigation of Domain Switching and Retention in Oriented PbZr0.3Ti0.7O3Thin Film by Scanning Force Microscopy

2002 ◽  
Vol 41 (Part 1, No. 11B) ◽  
pp. 6724-6729 ◽  
Author(s):  
Desheng Fu ◽  
Kazuyuki Suzuki ◽  
Kazumi Kato ◽  
Makoto Minakata ◽  
Hisao Suzuki
Keyword(s):  
Domain Switching ◽  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Scanning Force

scholarly journals Contrast Mechanism for Visualization of Ferroelectric Domains with Scanning Force Microscopy

2008 ◽  
Vol 14 (S2) ◽  
pp. 954-955 ◽  
Author(s):  
T Jungk ◽  
Á Hoffmann ◽  
E Soergel
Keyword(s):  
New Mexico ◽  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Ferroelectric Domains ◽  
Contrast Mechanism ◽  
Scanning Force

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Kinetics of ferroelectric domains investigated by scanning force microscopy

2000 ◽  
Vol 61 (21) ◽  
pp. 14440-14447 ◽  
Author(s):  
V. Likodimos ◽  
M. Labardi ◽  
M. Allegrini
Keyword(s):  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Ferroelectric Domains ◽  
Scanning Force ◽  
Kinetics Of

Scanning force microscopy: Application to nanoscale studies of ferroelectric domains

1998 ◽  
Vol 19 (1-4) ◽  
pp. 49-83 ◽  
Author(s):  
Alexei Gruverman ◽  
Orlando Auciello ◽  
Hiroshi Tokumoto
Keyword(s):  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Ferroelectric Domains ◽  
Scanning Force

scholarly journals Nanoscale Investigation of Polarization Retention Loss in Ferroelectric Thin Films VIA Scanning Force Microscopy

1997 ◽  
Vol 493 ◽  
Author(s):  
A. Gruverman ◽  
S. A. Prakash ◽  
S. Aggarwal ◽  
R. Ramesh ◽  
O. Auciello ◽  
...  
Keyword(s):  
Thin Films ◽  
Domain Switching ◽  
Scanning Force Microscopy ◽  
Ferroelectric Thin Films ◽  
Time Intervals ◽  
Force Microscopy ◽  
Retention Loss ◽  
Scanning Force ◽  
Local Polarization ◽  
Polarization Retention

ABSTRACTScanning force microscopy (SFM) was applied to direct nanoscale investigation of the mechanism of retention loss in ferroelectric thin films. Experiments were conducted by performing local polarization reversal within an individual grain with subsequent imaging of a resulting domain structure at various time intervals. A conductive SFM tip was used for domain switching and imaging in the SFM piezoresponse mode.

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