scholarly journals Amorphous Gallium Phosphate Thin Films : Ga and O K-Edge Absorption Spectroscopy

1997 ◽  
Vol 7 (C2) ◽  
pp. C2-975-C2-977 ◽  
Author(s):  
F. Tourtin ◽  
P. Armand ◽  
A. Ibanez ◽  
G. Tourillon ◽  
E. Philippot
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Edge Absorption ◽  
Gallium Phosphate

scholarly journals X-ray absorption spectroscopy elucidates the impact of structural disorder on electron mobility in amorphous zinc-tin-oxide thin films

2014 ◽  
Vol 104 (24) ◽  
pp. 242113 ◽  
Author(s):  
Sin Cheng Siah ◽  
Sang Woon Lee ◽  
Yun Seog Lee ◽  
Jaeyeong Heo ◽  
Tomohiro Shibata ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Tin Oxide ◽  
Electron Mobility ◽  
Structural Disorder ◽  
Oxide Thin Films ◽  
X Ray ◽  
Zinc Tin Oxide ◽  
The Impact ◽  
X Ray Absorption

X-ray Absorption Spectroscopy Study of TiO2–x Thin Films for Memory Applications

2015 ◽  
Vol 119 (8) ◽  
pp. 4362-4370 ◽  
Author(s):  
D. Carta ◽  
G. Mountjoy ◽  
A. Regoutz ◽  
A. Khiat ◽  
A. Serb ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Spectroscopy Study ◽  
X Ray ◽  
Memory Applications ◽  
X Ray Absorption

Polarized Optical Absorption Spectroscopy, NEXAFS, and GIXRD Measurements of Chain Alignment in Polyfluorene Thin Films

2008 ◽  
Vol 41 (17) ◽  
pp. 6463-6472 ◽  
Author(s):  
H. Cheun ◽  
X. Liu ◽  
F. J. Himpsel ◽  
M. Knaapila ◽  
U. Scherf ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Absorption Spectroscopy ◽  
Optical Absorption Spectroscopy ◽  
Chain Alignment

A practical method for determining film thickness using X-ray absorption spectroscopy in total electron yield mode

2021 ◽  
Vol 28 (6) ◽  
Author(s):  
Noritake Isomura ◽  
Keiichiro Oh-ishi ◽  
Naoko Takahashi ◽  
Satoru Kosaka
Keyword(s):  
Thin Films ◽  
Film Thickness ◽  
Absorption Spectroscopy ◽  
Electron Spectroscopy ◽  
Practical Method ◽  
Decay Length ◽  
Total Electron ◽  
X Ray ◽  
Logarithmic Equation ◽  
X Ray Absorption

Thin films formed on surfaces have a large impact on the properties of materials and devices. In this study, a method is proposed using X-ray absorption spectroscopy to derive the film thickness of a thin film formed on a substrate using the spectral separation and logarithmic equation, which is a modified version of the formula used in electron spectroscopy. In the equation, the decay length in X-ray absorption spectroscopy is longer than in electron spectroscopy due to a cascade of inelastic scattering of electrons generated in a solid. The modification factor, representing a multiple of the decay length, was experimentally determined using oxidized Si and Cu with films of thickness 19 nm and 39 nm, respectively. The validity of the proposed method was verified, and the results indicated that the method can be used in the analysis of various materials with thin films.

Linearly polarized CuK-edge absorption spectroscopy ofCuGeO3: Orbital population, band dispersion, and exchange interactions

1999 ◽  
Vol 59 (19) ◽  
pp. 12450-12456 ◽  
Author(s):  
D. Z. Cruz ◽  
M. Abbate ◽  
H. Tolentino ◽  
P. J. Schiling ◽  
E. Morikawa ◽  
...  
Keyword(s):  
Absorption Spectroscopy ◽  
Exchange Interactions ◽  
Edge Absorption ◽  
Orbital Population ◽  
Band Dispersion ◽  
Linearly Polarized
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