Pre-Edge Fine Structure (PEFS) of the K-XAS for the 3d Atoms in Compounds: A New Tool for Quantitative Atomic Structure Determination

1997 ◽  
Vol 7 (C2) ◽  
pp. C2-107-C2-110 ◽  
Author(s):  
R. V. Vedrinskii ◽  
V. L. Kraizman ◽  
A. A. Novakovich ◽  
Ph. V. Demekhin ◽  
S. V. Urazhdin ◽  
...  
Keyword(s):  
Fine Structure ◽  
Structure Determination ◽  
Atomic Structure

Simulated Dark-Field Electron Micrographs of Point Defects and Organometallics

1975 ◽  
Vol 33 ◽  
pp. 200-201
Author(s):  
William Krakow
Keyword(s):  
Electron Micrographs ◽  
Point Defects ◽  
Structure Determination ◽  
Atomic Structure ◽  
Image Interpretation ◽  
Dark Field ◽  
Field Electron ◽  
Dark Field Microscopy ◽  
Dark Field Electron

Tilted beam dark-field microscopy has been applied to atomic structure determination in perfect crystals, several synthesized molecules with heavy atcm markers and in the study of displaced atoms in crystals. Interpretation of this information in terms of atom positions and atom correlations is not straightforward. Therefore, calculated dark-field images can be an invaluable aid in image interpretation.

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