Systematic Study of the (ET)2I3 Reticulate Doped Polycarbonate Film: Structure, ESR, Transport Properties and Superconductivity

1997 ◽  
Vol 7 (12) ◽  
pp. 1665-1675 ◽  
Author(s):  
E. Laukhina ◽  
J. Ulanski ◽  
A. Khomenko ◽  
S. Pesotskii ◽  
V. Tkachev ◽  
...  
Author(s):  
Samiksha Malik ◽  
Elaine T Dias ◽  
Arun Kumar Nigam ◽  
Kaustubh R Priolkar

Abstract A systematic study of crystal structure, local structure, magnetic and transport properties in quenched and temper annealed Ni2−xMn1+xSn alloys indicate the formation of Mn3Sn type structural defects caused by an antisite disorder between Mn and Sn occupying the Y and Z sublattices of X2YZ Heusler structure. The antisite disorder is caused by the substitution of Ni by Mn at the X sites. On temper annealing, these defects segregate and phase separate into L21 Heusler and D019 Mn3Sn type phases.


2018 ◽  
Vol 116 ◽  
pp. 330-340 ◽  
Author(s):  
Snežana Papović ◽  
Slobodan Gadžurić ◽  
Marija Bešter-Rogač ◽  
Branislav Jović ◽  
Milan Vraneš

2001 ◽  
Vol 689 ◽  
Author(s):  
T. G. Holesinger ◽  
B. J. Gibbons ◽  
J. Y. Coulter ◽  
S. R. Foltyn ◽  
J. R. Groves ◽  
...  

ABSTRACTEach process used to deposit or make the bi-axially textured template, buffer layer(s), and the superconductor in a coated conductor creates interfaces along which defects or interfacial reactions may result. These defects can be additive and propagate through the entire film structure to affect the growth and properties of the superconducting film. Defects within the films and their corresponding transport properties have been correlated with the differences in the thickness of the underlying buffer layer material. This knowledge can be used to control and engineer the structure of the coated conductor to maximize critical current densities.


1990 ◽  
Vol 202 ◽  
Author(s):  
J. S. Morgan ◽  
T. J. Kistenmacher ◽  
W. A. Bryden ◽  
S. A. Ecelberger

ABSTRACTThe structure, morphology, and transport properties of thin films of InN grown on several cubic semiconductors has been studied as a function of substrate temperature. Films were deposited using rf-magnetron sputtering onto the (111) face of GaAs, Ge, Si and ZrO2. In general, the film structure is such that (00.1)InN parallels the (111) plane of the cubic substrate above some deposition temperature. The in-plane structural coherence duplicates the magnitude of the calculated lattice mismatch between InN and the substrate. Electrical transport properties for growth onto (111) ZrO2 were characterized by n-type carrier concentration and mobilities ranging up to 44 cm2 /Vsec. A morphology-induced decrease in electrical mobility is observed for deposition temperatures above 350°C, as shown by SEM.


RSC Advances ◽  
2021 ◽  
Vol 11 (60) ◽  
pp. 37995-38002
Author(s):  
Mohammad Bahmani ◽  
Mahdi Ghorbani-Asl ◽  
Thomas Frauenheim

Our systematic study shows significant improvement in transport properties of MoS2-based lateral T–H heterophase junctions when interfacial defects are present.


2018 ◽  
Vol 57 (12) ◽  
pp. 120314 ◽  
Author(s):  
Fuyuki Nabeshima ◽  
Masataka Kawai ◽  
Tomoya Ishikawa ◽  
Naoki Shikama ◽  
Atsutaka Maeda

RSC Advances ◽  
2021 ◽  
Vol 11 (4) ◽  
pp. 2353-2358
Author(s):  
Ye Yuan ◽  
Yue-Wen Fang ◽  
Yi-Feng Zhao ◽  
Chun-Gang Duan

We combine the piezoelectric wurtzite ZnO and the ferroelectric (111) BaTiO3 as a hexagonal closed-packed structure and report a systematic study on the ferroelectric behavior induced by the interface and the transport properties between electrodes.


2017 ◽  
Vol 27 (17) ◽  
pp. 1605380 ◽  
Author(s):  
Eve D. Hanson ◽  
Luc Lajaunie ◽  
Shiqiang Hao ◽  
Benjamin D. Myers ◽  
Fengyuan Shi ◽  
...  

Nanomaterials ◽  
2020 ◽  
Vol 11 (1) ◽  
pp. 8
Author(s):  
Ilya V. Chepkasov ◽  
Sergey V. Erohin ◽  
Pavel B. Sorokin

Recently, two-dimensional gallium and aluminum nitrides have triggered a vast interest in their tunable optical and electronic properties. Continuation of this research requires a detailed understanding of their atomic structure. Here, by using first-principles calculations we reported a systematic study of phase stability of 2D-GaN and 2D-AlN. We showed that the films undergo a phase transition from a graphene-like to a wurtzite structure with a thickness increase, whereas the early reported body-centered-tetragonal phase requires specific conditions for stabilization. Additionally, we studied how the functionalization of the surface can modify the film structure as exemplified by hydrogenation.


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