A Reflection Electron Microscopy Investigation of the Divergence of the Mean Correlated Difference of Step Displacements on a Si(111) Vicinal Surface
2002 ◽
Vol 82
(9)
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pp. 1741-1768
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2001 ◽
Vol 11
(1)
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pp. 3473-3476
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2009 ◽
Vol 43
(9)
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pp. 951-960
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1988 ◽
Vol 11
(2)
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pp. 218-226
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