High frequency characterization of the thin film ferrites BaM and YIG

2007 ◽  
Vol 39 (1) ◽  
pp. 45-50 ◽  
Author(s):  
Z. Zerrougui ◽  
A. Merzouki ◽  
D. Vincent
Keyword(s):  
Thin Film ◽  
High Frequency

High‐frequency characterization of thin‐film Y‐Ba‐Cu oxide superconducting transmission lines

1988 ◽  
Vol 52 (17) ◽  
pp. 1444-1446 ◽  
Author(s):  
Douglas R. Dykaar ◽  
Roman Sobolewski ◽  
James M. Chwalek ◽  
John F. Whitaker ◽  
Thomas Y. Hsiang ◽  
...  
Keyword(s):  
Thin Film ◽  
Transmission Lines ◽  
High Frequency

RF Magnetron Sputtered Ba0.96Ca0.04Ti0.84Zr0.16O3 Thin Films for High Frequency Applications

2004 ◽  
Vol 833 ◽  
Author(s):  
Ali Mahmud ◽  
T. S. Kalkur ◽  
N. Cramer
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Dielectric Constant ◽  
Substrate Temperature ◽  
High Frequency ◽  
Satellite Communications ◽  
Ferroelectric Thin Films ◽  
Paraelectric State ◽  
Deposited Films

ABSTRACTPerovskite ferroelectric thin films in the paraelectric state exhibit outstanding dielectric properties, even at high frequencies (>1 GHz). The tunable dielectric constant of ferroelectric thin films can be used to design frequency and phase agile components. High dielectric constant thin film ferroelectric materials in the paraelectric state have received enormous attention due to their feasibility in applications such as decoupling capacitors and tunable microwave capacitors; the latter application has been fueled by the recent explosion in wireless and satellite communications. This paper reportsBa0.96Ca 0.04Ti0.84Zr0.16O3 (BCTZ) thin films that were deposited on Pt electrodes using radio frequency magnetron sputtering at a low (450 °C) substrate temperature. Sputtered thin film BCTZ at low substrate temperature is compatible with conventional integrated circuit technology. The structural characterization of the deposited films was performed by x-ray diffraction. The electrical characterization of the films was achieved by capacitance-voltage, current-voltage, and S-parameter (via vector network analyzer) measurements. In addition, the effect of post annealing on the deposited films was investigated. A detailed understanding of both their processing and material properties is discussed for successful implementation in high frequency applications.

High Frequency Characterization of High Temperature Superconducting Thin-Film Lines

1991 ◽  
Vol 11 (2) ◽  
pp. 255-268 ◽  
Author(s):  
T. E. van Deventer ◽  
P. B. Katehi ◽  
J. Y. Josefowicz ◽  
D. B. Rensch
Keyword(s):  
Thin Film ◽  
High Temperature ◽  
High Frequency ◽  
Superconducting Thin Film ◽  
High Temperature Superconducting

scholarly journals Erratum: High‐frequency characterization of thin‐film Y‐Ba‐Cu oxide superconducting transmission lines [Appl. Phys. Lett. 52, 1444 (1988)]

1988 ◽  
Vol 52 (23) ◽  
pp. 2003-2003
Author(s):  
Douglas R. Dykaar ◽  
Roman Sobolewski ◽  
James M. Chwalek ◽  
John F. Whitaker ◽  
Thomas Y. Hsiang ◽  
...  
Keyword(s):  
Thin Film ◽  
Transmission Lines ◽  
High Frequency

Characterization of Thin-Film Decoupling and High-Frequency (Ba,Sr)TiO3Capacitors on Al2O3Ceramic Substrates

2004 ◽  
Vol 43 (9B) ◽  
pp. 6740-6745 ◽  
Author(s):  
Ivoyl P. Koutsaroff ◽  
Thomas A. Bernacki ◽  
Marina Zelner ◽  
Andrew Cervin-Lawry ◽  
Takehito Jimbo ◽  
...  
Keyword(s):  
Thin Film ◽  
High Frequency

A simple method for high-frequency characterization of (Ba,Sr)TiO3 thin film capacitors

1998 ◽  
Vol 20 (1-4) ◽  
pp. 215-224 ◽  
Author(s):  
Byung-Tak Jang ◽  
Dong-Hwa Kwak ◽  
Seon-Yong Cha ◽  
Seung-Hoon Lee ◽  
Hee Chul Lee
Keyword(s):  
Thin Film ◽  
High Frequency ◽  
Tio3 Thin Film ◽  
Simple Method ◽  
Thin Film Capacitors
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