Determination of the diffusion length and the optical self absorption coefficient using EBIC model

2001 ◽  
Vol 16 (1) ◽  
pp. 45-51 ◽  
Author(s):  
S. Guermazi ◽  
H. Guermazi ◽  
Y. Mlik ◽  
B. El Jani ◽  
C. Grill ◽  
...  
Keyword(s):  
Absorption Coefficient ◽  
Diffusion Length

A-Si:H Ambipolar Diffusion Length and Effective Lifetime Measured by Flying Spot Technique (FST)

1991 ◽  
Vol 219 ◽  
Author(s):  
M. Vieira ◽  
R. Martins ◽  
E. Fortunato ◽  
F. Soares ◽  
L. Guimaraes
Keyword(s):  
Laser Beam ◽  
Transient Analysis ◽  
Diffusion Length ◽  
Transport Equations ◽  
Ambipolar Diffusion ◽  
Schottky Barriers ◽  
Effective Lifetime ◽  
Asymmetrical Distribution ◽  
Flying Spot

ABSTRACTThe determination of the ambipolar diffusion length, L*, and the effective lifetime, τ*, in p/i and a-Si:H Schottky barriers (ITO/p/a-Si:H/Al-Si; Cr/a-Si:H/Cr/Ag) have been determined by Flying Spot Technique, FST. This technique consists in the transient analysis of the photocurrent/photopotential induced by a laser beam that moves perpendicularly to the structure with a constant motion ratio, at different velocities. Taking into account the competition between the diffusion/drift velocities of the excess carriers and the velocity of the flying spot, it is possible to solve the transport equations and to compute separately L* and τ*, from the asymmetrical distribution responses.

Quantitative photopyroelectric out-of-phase spectroscopy of amorphous silicon thin films deposited on crystalline silicon

1991 ◽  
Vol 69 (3-4) ◽  
pp. 317-323 ◽  
Author(s):  
Constantinos Christofides ◽  
Andreas Mandelis ◽  
Albert Engel ◽  
Michel Bisson ◽  
Gord Harling
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Absorption Coefficient ◽  
Dynamic Range ◽  
Crystalline Silicon ◽  
Optical Absorption Coefficient ◽  
Si Substrates ◽  
Silicon Thin Films ◽  
Background Compensation

A photopyroelectric spectrometer with real-time and(or) self-normalization capability was used for both conventional transmission and thermal-wave spectroscopic measurements of amorphous Si thin films, deposited on crystalline Si substrates. Optical-absorption-coefficient spectra were obtained from these measurements and the superior dynamic range of the out-of-phase (quadrature) photopyroelectric signal was established as the preferred measurement method, owing to its zero-background compensation capability. An extension of a photopyroelectric theoretical model was established and successfully tested in the determination of the optical absorption coefficient and the thermal diffusivity of the sample under investigation. Instrumental sensitivity limits of βt ≈ 5 × 10−3 were demonstrated.

The Use of Reverse Mirage Spectroscopy to Determine the Absorption Coefficient of Liquid Methanol at CO2 Laser Wavelengths

1989 ◽  
Vol 43 (1) ◽  
pp. 148-153 ◽  
Author(s):  
Dane Bićanić ◽  
Siegfried Krüger ◽  
Paul Torfs ◽  
Bruno Bein ◽  
Frans Harren
Keyword(s):  
Absorption Coefficient ◽  
Co2 Laser ◽  
Probe Beam ◽  
Laser Emission ◽  
Wavelength Region ◽  
Experimental Setup ◽  
Absorption Coefficients ◽  
Experimental Conditions ◽  
Liquid Samples

An experimental setup for performance of reverse mirage spectroscopy at CO2 laser wavelengths on liquid samples having high values of absorption coefficients is described. One and the same liquid is used as both the absorbing and deflecting medium. The Rosencwaig-Gersho theory has been applied, and the choice of experimental conditions that would enable determination of absorption coefficient β from the magnitude of photothermal signals measured at two different probe beam distances (probing locations) is discussed. The usefulness of this technique (essentially not inhibited by the requirements imposed on the sample's thickness) is tested on methanol having absorption coefficients β close to 300 cm−1 in the wavelength region covered by CO2 laser emission.

Sign in / Sign up

Export Citation Format

Share Document