Large-scale fingerprint recognition accelerated in hardware

Author(s):  
Raffaele Cappelli ◽  
Matteo Ferrara ◽  
Davide Maltoni
Author(s):  
S. Shanawaz Basha ◽  
N. Musrat Sultana

Biometrics refers to the automatic recognition of individuals based on their physiological and/or behavioral characteristics, such as faces, finger prints, iris, and gait. In this paper, we focus on the application of finger print recognition system. The spectral minutiae fingerprint recognition is a method to represent a minutiae set as a fixedlength feature vector, which is invariant to translation, and in which rotation and scaling become translations, so that they can be easily compensated for. Based on the spectral minutiae features, this paper introduces two feature reduction algorithms: the Column Principal Component Analysis and the Line Discrete Fourier Transform feature reductions, which can efficiently compress the template size with a reduction rate of 94%.With reduced features, we can also achieve a fast minutiae-based matching algorithm. This paper presents the performance of the spectral minutiae fingerprint recognition system, this fast operation renders our system suitable for a large-scale fingerprint identification system, thus significantly reducing the time to perform matching, especially in systems like, police patrolling, airports etc,. The spectral minutiae representation system tends to significantly reduce the false acceptance rate with a marginal increase in the false rejection rate.


2015 ◽  
Vol 15 (01) ◽  
pp. 1550007
Author(s):  
Shuiwang Li ◽  
Qijun Zhao ◽  
Xiangdong Fei

Reconstructing fingerprint images from a given set of minutiae is an important issue in analyzing the masquerade attack of automated fingerprint recognition systems (AFRSs) and in generating large scale databases of synthetic fingerprint images for the performance evaluation of AFRSs. Existing fingerprint reconstruction methods either cannot generate visually plausible or realistic fingerprint images, or suffer from the occurrence of false minutiae in the reconstructed fingerprint images. In this paper, we analyze the underlying reason of false minutiae generated by state-of-the-art amplitude modulation–frequency modulation (AM–FM)-based methods. Furthermore, we propose an improved approach by devising a better way to cope with the branch cuts (or discontinuities) in the fingerprint ridge orientation fields, and by introducing an effective scheme to remove false minutiae from the reconstructed fingerprint images. Compared with previous AM–FM based methods, the proposed method gets rid of block effects and successfully reduces the number of false minutiae. Theoretic proofs are provided with respect to the effectiveness of the proposed method for fingerprints with multiple singular points. The proposed method has also been evaluated on public fingerprint databases. The results demonstrate that it is superior to the existing methods in reconstructing realistic fingerprint images with fewer false minutiae.


2013 ◽  
Vol 303-306 ◽  
pp. 908-911 ◽  
Author(s):  
Jian Min Guo ◽  
Chun Xiao Ren ◽  
Yu Xiao Wu

The need for sensor interoperability has increased tremendously in many large-scale fingerprint applications such as e-commerce, welfare-disbursement and e-education. In this paper, we present fingerprint scaling, an innovative fingerprint system module, which resizes the fingerprint images to solve the problem of sensor interoperability with minimum modification to existing system. In template-based scaling methods, we have developed an estimation method using Delaunay triangulation algorithm. The efficacy of the scaling technique has been assessed by embedding a scaling module into a traditional fingerprint recognition system. Our experiments have shown very positive results. Experimental results indicated that the accuracy and robustness of fingerprint system can be improved effectively by embedding such a scaling module into the traditional framework of fingerprint systems under multi-sensor situation.


1999 ◽  
Vol 173 ◽  
pp. 243-248
Author(s):  
D. Kubáček ◽  
A. Galád ◽  
A. Pravda

AbstractUnusual short-period comet 29P/Schwassmann-Wachmann 1 inspired many observers to explain its unpredictable outbursts. In this paper large scale structures and features from the inner part of the coma in time periods around outbursts are studied. CCD images were taken at Whipple Observatory, Mt. Hopkins, in 1989 and at Astronomical Observatory, Modra, from 1995 to 1998. Photographic plates of the comet were taken at Harvard College Observatory, Oak Ridge, from 1974 to 1982. The latter were digitized at first to apply the same techniques of image processing for optimizing the visibility of features in the coma during outbursts. Outbursts and coma structures show various shapes.


1994 ◽  
Vol 144 ◽  
pp. 29-33
Author(s):  
P. Ambrož

AbstractThe large-scale coronal structures observed during the sporadically visible solar eclipses were compared with the numerically extrapolated field-line structures of coronal magnetic field. A characteristic relationship between the observed structures of coronal plasma and the magnetic field line configurations was determined. The long-term evolution of large scale coronal structures inferred from photospheric magnetic observations in the course of 11- and 22-year solar cycles is described.Some known parameters, such as the source surface radius, or coronal rotation rate are discussed and actually interpreted. A relation between the large-scale photospheric magnetic field evolution and the coronal structure rearrangement is demonstrated.


2000 ◽  
Vol 179 ◽  
pp. 205-208
Author(s):  
Pavel Ambrož ◽  
Alfred Schroll

AbstractPrecise measurements of heliographic position of solar filaments were used for determination of the proper motion of solar filaments on the time-scale of days. The filaments have a tendency to make a shaking or waving of the external structure and to make a general movement of whole filament body, coinciding with the transport of the magnetic flux in the photosphere. The velocity scatter of individual measured points is about one order higher than the accuracy of measurements.


Author(s):  
Simon Thomas

Trends in the technology development of very large scale integrated circuits (VLSI) have been in the direction of higher density of components with smaller dimensions. The scaling down of device dimensions has been not only laterally but also in depth. Such efforts in miniaturization bring with them new developments in materials and processing. Successful implementation of these efforts is, to a large extent, dependent on the proper understanding of the material properties, process technologies and reliability issues, through adequate analytical studies. The analytical instrumentation technology has, fortunately, kept pace with the basic requirements of devices with lateral dimensions in the micron/ submicron range and depths of the order of nonometers. Often, newer analytical techniques have emerged or the more conventional techniques have been adapted to meet the more stringent requirements. As such, a variety of analytical techniques are available today to aid an analyst in the efforts of VLSI process evaluation. Generally such analytical efforts are divided into the characterization of materials, evaluation of processing steps and the analysis of failures.


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