Appendix 2: X photoemission spectroscopy (XPS) and secondary ions mass spectroscopy (ToF SIMS)

2011 ◽  
pp. 193-198
Author(s):  
R. Gouttebaron ◽  
M. Hecq
Keyword(s):  
Mass Spectroscopy ◽  
Photoemission Spectroscopy ◽  
Tof Sims ◽  
Secondary Ions

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

Aging of the surface of an Al-Cr-Fe approximant phase in ambient conditions: chemical composition and physical properties

2003 ◽  
Vol 805 ◽  
Author(s):  
D. Veys ◽  
P. Weisbecker ◽  
V. Fournée ◽  
B. Domenichini ◽  
S. Weber ◽  
...  
Keyword(s):  
Chemical Composition ◽  
Mass Spectroscopy ◽  
Electrochemical Behavior ◽  
Stable State ◽  
Photoemission Spectroscopy ◽  
Atmospheric Conditions ◽  
Electrical Model ◽  
Ambient Conditions ◽  
X Ray ◽  
Angle Resolved Photoemission Spectroscopy

ABSTRACTWe have investigated the surface properties of quasicrystalline and approximant phases in the Al-(Cu)-Cr-Fe system upon aging in ambient conditions. We found that some of these properties (like the electrochemical behavior, wetting or friction) slowly evolves with the length of exposure to normal atmospheric conditions, reaching a stable state only after several days. This report essentially focuses on one of these alloys, an Al65Cr27Fe8 approximant phase with g-brass structure. In a first part, we describe the effect of aging on the electrochemical behavior of this alloy and we propose an interpretation based on a simple electrical model of the oxidized surface. In a second part, we present a model describing the surface as a stacking of several layers (oxides, oxy-hydroxides, contamination) whose thickness evolves with time. The model is supported by X-ray reflectivity, angle-resolved photoemission spectroscopy and secondary neutral mass spectroscopy measurements.

ITO-Based Cathode for Application in Semitransparent Organic Photovoltaic Cells

2007 ◽  
Vol 1013 ◽  
Author(s):  
Ging-Meng Ng ◽  
Elizabeth Lekha Kietzke ◽  
Thomas Kietzke ◽  
Li-Wei Tan ◽  
Pooi-Kwan Liew ◽  
...  
Keyword(s):  
Optical Properties ◽  
Calcium Oxide ◽  
Mass Spectroscopy ◽  
High Performance ◽  
Fill Factor ◽  
Photovoltaic Cells ◽  
Organic Photovoltaic ◽  
Tof Sims ◽  
Secondary Ion ◽  
Sims Depth Profile

AbstractA high performance semitransparent cathode is one of the major impediments to the high performance semitransparent and tandem organic photovoltaic (OPV) cells. In this work, we discuss the possible designs of semitransparent cathode to improve the performance of semitransparent OPV cells. The optical properties of the poly(3-hexylthiophene) (P3HT): 1-(3-methoxycarbonyl)-propyl-1-phenyl-(6,6)C61 (PCBM)-based OPV cells were studied by the optical admittance analysis. The performance of the OPV cells made with an opaque Ca(10nm)/Ag(100nm) cathode and a semitransparent Ca(10nm)/Ag(10nm)/ITO cathode are discussed. The interfacial properties at the cathode/organic interface were analyzed using the time-of-flight secondary ion mass spectroscopy (TOF-SIMS). The TOF-SIMS depth profile revealed that calcium oxide formed at the Ca/organic interface in semitransparent OPV cells, which was induced by the ITO sputtering process. It shows that the presence of calcium oxide at the organic/cathode interface could be the main reason resulting in a poor fill factor of a semitransparent OPV cell (∼23%) as compared to that of a reference cell (∼43%).

Fragmentation mechanism of the phenylcoumaran-type lignin model compound by ToF-SIMS

Holzforschung ◽  
2013 ◽  
Vol 67 (4) ◽  
pp. 365-370 ◽  
Author(s):  
Yasuyuki Matsushita ◽  
Kousuke Ioka ◽  
Kaori Saito ◽  
Ruka Takama ◽  
Dan Aoki ◽  
...  
Keyword(s):  
Model Compound ◽  
Furan Ring ◽  
Secondary Ion Mass Spectrometry ◽  
Model Compounds ◽  
Lignin Model Compound ◽  
Tof Sims ◽  
Secondary Ions ◽  
Lignin Model ◽  
The Common ◽  
Secondary Ion

Abstract The experiments with model compounds revealed that time-of-flight secondary ion mass spectrometry (ToF-SIMS) is able to split the common interunit linkages of lignin, except the 5-5 linkage. In a previous study, ToF-SIMS produced characteristic secondary ions with m/z 137 and 151 (C6-C1 fragments) from the phenylcoumaran-type lignin model compound, the benzofuran ring of which has a β-5 linkage and an α-O-4 linkage. However, it is still unclear whether the fragments are from ring A with the free phenolic OH as a result of the sole cleavage of the α-O-4 link by opening the furan ring or from ring B as a result of the β-5 cleavage. In this study, the phenylcoumaran-type lignin model compound and its deuterium- and/or 13C-labeled analogues were synthesized and analyzed by ToF-SIMS. It could be clarified that the β-5 linkage is not cleaved by ToF-SIMS.

Improvement of the gas cluster ion beam-(GCIB)-based molecular secondary ion mass spectroscopy (SIMS) depth profile with O2+ cosputtering

The Analyst ◽  
2016 ◽  
Vol 141 (8) ◽  
pp. 2523-2533 ◽  
Author(s):  
Yi-Hsuan Chu ◽  
Hua-Yang Liao ◽  
Kang-Yi Lin ◽  
Hsun-Yun Chang ◽  
Wei-Lun Kao ◽  
...  
Keyword(s):  
Steady State ◽  
Depth Profile ◽  
Mass Spectroscopy ◽  
Ion Beam ◽  
Depth Profiles ◽  
Tof Sims ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Secondary Ion ◽  
Sims Depth Profile

The Ar2500+ and O2+ cosputter in ToF-SIMS depth profiles retained >95% molecular ion intensity in the steady-state.

ToF-SIMS, Time-of-Flight Secondary Ion Mass Spectroscopy for Counterfeit Detection of Electrical, Electronic, and Electromechanical (EEE) Parts

2019 ◽  
Author(s):  
M. Simard-Normandin ◽  
C. Banks ◽  
N. Havercroft ◽  
P. Clark ◽  
E. Tallarek
Keyword(s):  
Mass Spectroscopy ◽  
Light Emitting Diode ◽  
Semiconductor Devices ◽  
Time Of Flight ◽  
Epitaxial Layers ◽  
Secondary Ion Mass Spectroscopy ◽  
Light Emitting ◽  
Led Light ◽  
Tof Sims ◽  
Secondary Ion

Abstract This presentation demonstrates how Time-of-Flight Secondary Ion Mass Spectroscopy provides unique information to identify suspect counterfeit semiconductor devices. An example is shown where the epitaxial layers of a light emitting device (LED) do not match those of the exemplar. Keywords: Secondary Ion Mass Spectroscopy, SIMS, counterfeit detection, LED, Light emitting diode.

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