Channel waveguides formed in fused silica and silica-on-silicon by Si, P and Ge ion implantation

1996 ◽  
Vol 143 (5) ◽  
pp. 281-286 ◽  
Author(s):  
P.W. Leech ◽  
M. Ridgway ◽  
M. Faith
1995 ◽  
Vol 392 ◽  
Author(s):  
Patrick W. Leech ◽  
Mark C. Ridgway

AbstractThe implantation of MeV Ge3+ ions into fused silica has been used to fabricate single mode channel waveguides with a low propagation loss of 0.10–0.15 dB/cm. The loss coefficient, α, has been measured as a function of ion dose (8 × 1013 to 8 × 1016 ions/cm2) and annealing temperature (250 to 600 °C) at λ = 1300 nm. The value of cc for the as-implanted waveguides exhibited a minimum of -1.0 dB/cm at an intermediate range of dose from 8 × 1014 to 8 × 1015 ions/cm2. A progressive reduction in α occurred as the annealing temperature was increased from 300 to 500 °C. Annealing of the implanted waveguides at 500 °C for 1 h has produced an order of magnitude decrease in α to 0.1 dB/cm at 8 × 1014 ions/cm2. At doses which were outside of the intermediate range, the value of α was ≥ 10 dB/cm. This trend in α with ion dose has been attributed to the dominance of a residual nuclear component of damage after annealing.


1995 ◽  
Vol 31 (15) ◽  
pp. 1238-1240 ◽  
Author(s):  
P.W. Leech ◽  
M.C. Ridgway ◽  
P.C. Kemeny

2017 ◽  
Vol 46 (4) ◽  
pp. 413001 ◽  
Author(s):  
刘秀红 LIU Xiu-hong ◽  
韩海燕 HAN Hai-yan ◽  
朱巧芬 ZHU Qiao-fen ◽  
黄艳宾 HUANG Yan-bin ◽  
董昭 DONG Zhao

1994 ◽  
Vol 76 (2) ◽  
pp. 708-715 ◽  
Author(s):  
R. H. Magruder ◽  
R. F. Haglund ◽  
L. Yang ◽  
J. E. Wittig ◽  
R. A. Zuhr

Author(s):  
J. Albert ◽  
B. Malo ◽  
D. C. Johnson ◽  
K. O. Hill ◽  
J. L. Brebner ◽  
...  

1998 ◽  
Vol 540 ◽  
Author(s):  
A. Meldrum ◽  
L.A. Boatner ◽  
C.W. White ◽  
D.O. Henderson

AbstractRadiation effects in nonmetals have been studied for well over a century by geologists, mineralogists, physicists, and materials scientists. The present work focuses on recent results of investigations of the ion-beam-induced amorphization of the ABO4 compounds – including the orthophosphates (LnPO4; Ln = lanthanides) and the orthosilicates: zircon (ZrSiO4), hafnon (HfSiO4), and thorite (ThSiO4). In the case of the orthosilicates, heavy-ion irradiation at elevated temperatures causes the precipitation of a nanocrystalline metal oxide. Electron irradiation effects in these amorphized insulating ceramics can produce localized recrystallization on a nanometer scale. Similar electron irradiation techniques were used to nucleate monodispersed compound semiconductor nanocrystals formed by ion implantation of the elemental components into fused silica. Methods for the formation of novel structural relationships between embedded nanocrystals and their hosts have been developed and the results presented here demonstrate the general flexibility of ion implantation and irradiation techniques for producing unique near-surface microstructures in ion-implanted host materials.


2013 ◽  
Vol 52 ◽  
pp. 10-14 ◽  
Author(s):  
Chun-Xiao Liu ◽  
Shu Cheng ◽  
Jin-Hua Zhao ◽  
Wei-Nan Li ◽  
Wei Wei ◽  
...  

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