Analysis of double-gate FinFET-based address decoder for radiation-induced single-event-transients

2012 ◽  
Vol 6 (4) ◽  
pp. 218 ◽  
Author(s):  
S.S. Rathod ◽  
A.K. Saxena ◽  
S. Dasgupta
Keyword(s):  
Double Gate ◽  
Single Event ◽  
Single Event Transients ◽  
Radiation Induced

On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs

2018 ◽  
Vol 88-90 ◽  
pp. 936-940 ◽  
Author(s):  
S. Azimi ◽  
L. Sterpone ◽  
B. Du ◽  
L. Boragno
Keyword(s):  
Single Event ◽  
Single Event Transients ◽  
Radiation Induced

INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASER

2004 ◽  
Vol 14 (02) ◽  
pp. 327-339 ◽  
Author(s):  
P. Fouillat ◽  
V. Pouget ◽  
D. Lewis ◽  
S. Buchner ◽  
D. McMorrow
Keyword(s):  
Integrated Circuits ◽  
Failure Mechanisms ◽  
Pulsed Laser ◽  
Single Event ◽  
Testing Method ◽  
Single Event Transients ◽  
Radiation Induced

This paper describes the use of a pulsed laser for studying radiation-induced single-event transients in integrated circuits. The basic failure mechanisms and the fundamentals of the laser testing method are presented. Sample results are presented to illustrate the benefits of using a pulsed laser for studying single-event transients.

Modeling the sensitivity of CMOS circuits to radiation induced single event transients

2008 ◽  
Vol 48 (1) ◽  
pp. 29-36 ◽  
Author(s):  
Gilson I. Wirth ◽  
Michele G. Vieira ◽  
Egas H. Neto ◽  
Fernanda Lima Kastensmidt
Keyword(s):  
Cmos Circuits ◽  
Single Event ◽  
Single Event Transients ◽  
Radiation Induced
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