Efficient test cost reduction procedure for parallel-serial scan circuits

2001 ◽  
Vol 37 (21) ◽  
pp. 1277 ◽  
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Keyword(s):  
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Efficient Test ◽  
Test Cost Reduction ◽  
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scholarly journals A scan disabling-based BAST scheme for test cost reduction

2011 ◽  
Vol 8 (16) ◽  
pp. 1367-1373 ◽  
Author(s):  
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Keyword(s):  
Cost Reduction ◽  
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Test Cost Reduction

BIST-aided scan test - a new method for test cost reduction

2003 ◽  
Author(s):  
T. Hiraide ◽  
Kwame Osei Boateng ◽  
H. Konishi ◽  
K. Itaya ◽  
M. Emori ◽  
...  
Keyword(s):  
Cost Reduction ◽  
New Method ◽  
Test Cost ◽  
Scan Test ◽  
Test Cost Reduction
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