10 Gbit/s high sensitivity, low-voltage-operation avalanche photodiodes with thin InAlAs multiplication layer and waveguide structure

2000 ◽  
Vol 36 (24) ◽  
pp. 2033 ◽  
Author(s):  
T. Nakata ◽  
T. Takeuchi ◽  
I. Watanabe ◽  
K. Makita ◽  
T. Torikai
Keyword(s):  
Low Voltage ◽  
Avalanche Photodiodes ◽  
High Sensitivity ◽  
Waveguide Structure ◽  
Low Voltage Operation

High-Strain Ionomeric-Ionic Liquid Composites via Electrode Tailoring

Aerospace ◽  
2004 ◽  
Author(s):  
Barbar J. Akle ◽  
Mathew D. Bennett ◽  
Donald J. Leo
Keyword(s):  
Ionic Liquid ◽  
High Strain ◽  
Low Voltage ◽  
Volume Ratio ◽  
High Sensitivity ◽  
Low Voltage Operation ◽  
Ionomer Membranes ◽  
Electrode Interface ◽  
Electromechanical Transducers ◽  
Electrode Composition

Ionomeric polymers are a class of electromechanical transducer consisting of an ionomeric substrate with metal-plated electrodes. Application of a low voltage (< 5 V) across the thickness of the membrane produces controllable strain. The advantage of ionomeric polymers compared to other types of electromechanical transducers (e.g. piezoelectric polymers) is low-voltage operation, high strain capability, and high sensitivity in charge mode. Two of the primary limitations of ionomeric polymers for electromechanical transducers are unstable operation in air and solvent breakdown at low voltage. This work focuses on overcoming these limitations through the development of an ionic liquid-ionomeric composite with a tailored electrode composition that maximizes strain output. It is becoming clear that charge accumulation at the polymer-electrode interface is the key to producing high strain in ionomeric polymer transducers. In this work we combine a previously developed process for incorporating ionic liquids into ionomer membranes with a new method for tailoring the electrode composition. The electrode composition is studied as a function of the surface-to-volume ratio and conductivity of the metal particulates. Results demonstrate that the surface-to-volume ratio of the metal particulate is critical to increasing the capacitance of the transducer. Increased conductivity of the metal particulates produces improved response at higher frequencies (> 10 Hz) but this effect is small compared to the increase in strain produced by maximizing the capacitance. Increasing capacitance produces a transducer that is able to achieve > 2% strain at voltage levels of +/- 3 V.

Current State of Biological High-Resolution Scanning Electron Microscopy

1988 ◽  
Vol 46 ◽  
pp. 180-181 ◽  
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
High Performance ◽  
Low Voltage ◽  
Backscattered Electrons ◽  
Lens Position ◽  
Low Voltage Operation ◽  
Signal Collection ◽  
Probe Size ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

A new generation of high performance field emission scanning electron microscopes (FSEM) is now commercially available (JEOL 890, Hitachi S 900, ISI OS 130-F) characterized by an "in lens" position of the specimen where probe diameters are reduced and signal collection improved. Additionally, low voltage operation is extended to 1 kV. Compared to the first generation of FSEM (JE0L JSM 30, Hitachi S 800), which utilized a specimen position below the final lens, specimen size had to be reduced but useful magnification could be impressively increased in both low (1-4 kV) and high (5-40 kV) voltage operation, i.e. from 50,000 to 200,000 and 250,000 to 1,000,000 x respectively.At high accelerating voltage and magnification, contrasts on biological specimens are well characterized1 and are produced by the entering probe electrons in the outmost surface layer within -vl nm depth. Backscattered electrons produce only a background signal. Under these conditions (FIG. 1) image quality is similar to conventional TEM (FIG. 2) and only limited at magnifications >1,000,000 x by probe size (0.5 nm) or non-localization effects (%0.5 nm).

High resolution at low voltage: A new approach

1989 ◽  
Vol 47 ◽  
pp. 76-77
Author(s):  
Arthur V. Jones
Keyword(s):  
Low Voltage ◽  
Emission Sources ◽  
New Approach ◽  
Design Concepts ◽  
Probe Diameter ◽  
Low Voltage Operation ◽  
Sufficient Intensity ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Immersion Type

With the introduction of field-emission sources and “immersion-type” objective lenses, the resolution obtainable with modern scanning electron microscopes is approaching that obtainable in STEM and TEM-but only with specific types of specimens. Bulk specimens still suffer from the restrictions imposed by internal scattering and the need to be conducting. Advances in coating techniques have largely overcome these problems but for a sizeable body of specimens, the restrictions imposed by coating are unacceptable.For such specimens, low voltage operation, with its low beam penetration and freedom from charging artifacts, is the method of choice.Unfortunately the technical dificulties in producing an electron beam sufficiently small and of sufficient intensity are considerably greater at low beam energies — so much so that a radical reevaluation of convential design concepts is needed.The probe diameter is usually given by

Low-voltage operation of the organic thin film transistor with a diagonal configuration

2003 ◽  
Author(s):  
Toshihide Kamata ◽  
Manabu Yoshida ◽  
Sei Uemura ◽  
Satoshi Hoshino ◽  
Noriyuki Takada ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Voltage ◽  
Thin Film Transistor ◽  
Organic Thin Film ◽  
Organic Thin Film Transistor ◽  
Low Voltage Operation
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