Network sensitivities in terms of scattering parameters

G. Iuculano; V.A. Monaco; P. Tiberio

doi:10.1049/el:19710037

Experimental investigation and modelling of light scattering in a-Si:H solar cells deposited on glass/ZnO:Al substrates

MRS Proceedings ◽

10.1557/proc-715-a13.3 ◽

2002 ◽

Vol 715 ◽

Cited By ~ 3

Author(s):

J. Krc ◽

M. Zeman ◽

O. Kluth ◽

F. Smole ◽

M. Topic

Keyword(s):

Surface Roughness ◽

Experimental Investigation ◽

Solar Cells ◽

Angular Distribution ◽

Light Scattering ◽

Optical Model ◽

Distribution Functions ◽

Interface Roughness ◽

Scattering Parameters ◽

Good Agreement

AbstractThe descriptive scattering parameters, haze and angular distribution functions of textured ZnO:Al transparent conductive oxides with different surface roughness are measured. An approach to determine the scattering parameters of all internal interfaces in p-i-n a-Si:H solar cells deposited on the glass/ZnO:Al substrates is presented. Using the determined scattering parameters as the input parameters of the optical model, a good agreement between the measured and simulated quantum efficiencies of the p-i-n a-Si:H solar cells with different interface roughness is achieved.

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Single Image Dehazing by Predicting Atmospheric Scattering Parameters

London Imaging Meeting ◽

10.2352/issn.2694-118x.2020.lim-11 ◽

2020 ◽

Vol 2020 (1) ◽

pp. 74-77

Author(s):

Simone Bianco ◽

Luigi Celona ◽

Flavio Piccoli

Keyword(s):

Reference Image ◽

Single Image ◽

Scattering Parameters ◽

Image Dehazing ◽

Atmospheric Scattering ◽

Local Structures ◽

Full Reference ◽

Reconstruction Quality ◽

Single Image Dehazing

In this work we propose a method for single image dehazing that exploits a physical model to recover the haze-free image by estimating the atmospheric scattering parameters. Cycle consistency is used to further improve the reconstruction quality of local structures and objects in the scene as well. Experimental results on four real and synthetic hazy image datasets show the effectiveness of the proposed method in terms of two commonly used full-reference image quality metrics.

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Minimization of the volume of reliability tests of the machines under development taking into account the reliability functions for certain types of failures

10.36652/0042-4633-2020-3-33-36 ◽

2020 ◽

pp. 33-36

Author(s):

A.S. Ivanov

Keyword(s):

Random Variables ◽

Test Time ◽

Scattering Parameters ◽

Degradation Failure

A method of minimizing the volume of reliability tests for non-recoverable machines at the stage of their development by increasing the test time and using forced modes is described. Keywords tests, degradation failure, reliability, scattering parameters, random variables [email protected]

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Power waves and scattering parameters in magneto-inductive systems

AIP Advances ◽

10.1063/5.0049806 ◽

2021 ◽

Vol 11 (4) ◽

pp. 045327

Author(s):

A. Voronov ◽

O. Sydoruk ◽

R. R. A. Syms

Keyword(s):

Scattering Parameters

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Application of Scattering Parameters to DPL Time-Lag Parameter Estimation at Nanoscale in Modern Integration Circuit Structures

Energies ◽

10.3390/en14154425 ◽

2021 ◽

Vol 14 (15) ◽

pp. 4425

Author(s):

Mariusz Zubert ◽

Zbigniew Kulesza ◽

Mariusz Jankowski ◽

Andrzej Napieralski

Keyword(s):

Integrated Circuits ◽

Time Lag ◽

Estimation Procedure ◽

Micro Electro Mechanical System ◽

Hafnium Dioxide ◽

Parameters Estimation ◽

Phase Lag ◽

Scattering Parameters ◽

Materials Used ◽

Temperature Time

This paper presents the methodology of material parameters’ estimation for the dual-phase-lag (DPL) model at the nanoscale in modern integration circuit (IC) structures. The analyses and measurements performed were used in the unique dedicated micro-electro-mechanical system (MEMS) test structure. The electric and thermal domain of this structure was analysed. Finally, the silicon dioxide (SiO2) temperature time-lag estimation procedure is presented based on the scattering parameters measured by a vector network analyser for the considered MEMS structure together with the 2-omega method. The proposed methodology has the ability to estimate the time-lag parameter with high accuracy and is also suitable for the temperature time-lag estimation for other manufacturing process technologies of ICs and other insulation materials used for integrated circuits such as silicon nitride (Si3N4), titanium nitride (TiN), and hafnium dioxide (HfO2).

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Single Step 2-Port Device De-Embedding Algorithm for Fixture-DUT-Fixture Network Assembly

Electronics ◽

10.3390/electronics10111275 ◽

2021 ◽

Vol 10 (11) ◽

pp. 1275

Author(s):

Simone Scafati ◽

Enza Pellegrino ◽

Francesco de Paulis ◽

Carlo Olivieri ◽

James Drewniak ◽

...

Keyword(s):

Standard Technique ◽

Single Step ◽

Scattering Parameters ◽

Linear Set ◽

S Parameter ◽

Parameter Conversion ◽

Before And After ◽

One Step ◽

Typical Measurement

The de-embedding of measurement fixtures is relevant for an accurate experimental characterization of radio frequency and digital electronic devices. The standard technique consists in removing the effects of the measurement fixtures by the calculation of the transfer scattering parameters (T-parameters) from the available measured (or simulated) global scattering parameters (S-parameters). The standard de-embedding is achieved by a multiple steps process, involving the S-to-T and subsequent T-to-S parameter conversion. In a typical measurement setup, two fixtures are usually placed before and after the device under test (DUT) allowing the connection of the device to the calibrated vector network analyzer coaxial ports. An alternative method is proposed in this paper: it is based on the newly developed multi-network cascading algorithm. The matrices involved in the fixture-DUT-fixture cascading gives rise to a non-linear set of equations that is in one step analytically solved in closed form, obtaining a unique solution. The method is shown to be effective and at least as accurate as the standard multi-step de-embedding one.

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