scholarly journals Simplified implementation of millimetre‐wave zero‐bias detector for an accurate detection in six‐port‐based receivers

2020 ◽  
Vol 56 (1) ◽  
pp. 13-15
Author(s):  
C. Hannachi ◽  
M.E. Romaric ◽  
S.O. Tatu ◽  
K. Wu
Keyword(s):  
Zero Bias ◽  
Millimetre Wave ◽  
Accurate Detection

Zero-bias edge-coupled InGaAs photodiodes in millimetre-wave radio-fibre systems

1993 ◽  
Vol 29 (21) ◽  
pp. 1879 ◽  
Author(s):  
D. Wake ◽  
N.G. Walker ◽  
I.C. Smith
Keyword(s):  
Zero Bias ◽  
Millimetre Wave ◽  
Wave Radio

High voltage sensitivity GaAs planar doped barrier diodes for microwave∕millimetre-wave zero-bias power detector applications

2004 ◽  
Vol 40 (5) ◽  
pp. 343 ◽  
Author(s):  
V.T. Vo ◽  
Z.R. Hu ◽  
K.L. Koon ◽  
C.N. Dharmasiri ◽  
S.C. Subramaniam ◽  
...  
Keyword(s):  
High Voltage ◽  
Voltage Sensitivity ◽  
Zero Bias ◽  
Millimetre Wave ◽  
Bias Power ◽  
Power Detector

A novel millimetre-wave gallium arsenide beam-lead mixer diode with cutoff frequency > 2 THz

1991 ◽  
Vol 69 (3-4) ◽  
pp. 180-184 ◽  
Author(s):  
Hsien-Ching Huang ◽  
Arvind Swarup ◽  
Richard Henderson
Keyword(s):  
Figure Of Merit ◽  
Series Resistance ◽  
Cutoff Frequency ◽  
Polyimide Film ◽  
Parasitic Capacitance ◽  
Zero Bias ◽  
Millimetre Wave ◽  
Novel Structure ◽  
Production Techniques ◽  
Beam Lead

A low-parasitic-capacitance beam-lead Schottky diode has been developed for millimetre-wavelength mixer applications from 30–110 GHz. It has a novel structure that incorporates a polyimide film to support the beam leads and the GaAs active area. Typical devices have an ideality factor of 1.12, a parasitic capacitance of 10 fF, a zero-bias-junction capacitance of 20 fF, a series resistance of 2.5 Ω, and hence a figure of merit cutoff frequency of over 3 THz. Diodes tested in production mixers at 36 GHz have yielded a conversion loss of 5.14 dB. The devices, fabricated by repeatable production techniques, are mechanically rugged and suitable for qualification to space and defence standards.

Millimetre-wave and infrared spectroscopy of Br13 CN: anharmonic force field of cyanogen bromide from spectroscopic data and ab initio calculations

1997 ◽  
Vol 90 (3) ◽  
pp. 495-497
Author(s):  
CLAUDIO ESPOSTI ◽  
FILIPPO TAMASSIA ◽  
CRISTINA PUZZARINI ◽  
RICCARDO TARRONI ◽  
ZDENEK ZELINGER
Keyword(s):  
Infrared Spectroscopy ◽  
Force Field ◽  
Ab Initio Calculations ◽  
Ab Initio ◽  
Spectroscopic Data ◽  
Cyanogen Bromide ◽  
Millimetre Wave ◽  
Anharmonic Force

Millimetre-wave spectrum of the Ar-CO complex: the K = 2 ← 1 and 3 ← 2 subbands

1997 ◽  
Vol 92 (2) ◽  
pp. 229-236 ◽  
Author(s):  
M. HEPP ◽  
R. GENDRIESCH ◽  
I. PAK ◽  
Y.A. KURITSYN ◽  
F. LEWEN ◽  
...  
Keyword(s):  
Wave Spectrum ◽  
Millimetre Wave

Transitions in open millimetre-wave waveguides

1989 ◽  
Vol 136 (6) ◽  
pp. 487
Author(s):  
S.T. Peng ◽  
S.J. Xu ◽  
F.K. Schwering
Keyword(s):  
Millimetre Wave

Techniques for assessing the performance of circuit materials at microwave and millimetre-wave frequencies

2003 ◽  
Vol 783 ◽  
Author(s):  
Charles E Free
Keyword(s):  
Loss Tangent ◽  
Good Accuracy ◽  
Low Cost ◽  
Resonant Cavity ◽  
New Technique ◽  
Millimetre Wave ◽  
A New Technique

This paper discusses the techniques that are available for characterising circuit materials at microwave and millimetre wave frequencies. In particular, the paper focuses on a new technique for measuring the loss tangent of substrates at mm-wave frequencies using a circular resonant cavity. The benefits of the new technique are that it is simple, low cost, capable of good accuracy and has the potential to work at high mm-wave frequencies.

Accurate Detection and Quantization of Leaf- Diseases through Soft Computing

2018 ◽  
Vol 1 (1) ◽  
pp. 236-247
Author(s):  
Divya Srivastava ◽  
Rajitha B. ◽  
Suneeta Agarwal
Keyword(s):  
Machine Learning ◽  
Image Processing ◽  
Agricultural Production ◽  
Bacterial Blight ◽  
Early Stage ◽  
Second Phase ◽  
Computationally Efficient ◽  
Stage Of Disease ◽  
Accurate Detection ◽  
Two Phases

Diseases in leaves can cause the significant reduction in both quality and quantity of agricultural production. If early and accurate detection of disease/diseases in leaves can be automated, then the proper remedy can be taken timely. A simple and computationally efficient approach is presented in this paper for disease/diseases detection on leaves. Only detecting the disease is not beneficial without knowing the stage of disease thus the paper also determine the stage of disease/diseases by quantizing the affected of the leaves by using digital image processing and machine learning. Though there exists a variety of diseases on leaves, but the bacterial and fungal spots (Early Scorch, Late Scorch, and Leaf Spot) are the most prominent diseases found on leaves. Keeping this in mind the paper deals with the detection of Bacterial Blight and Fungal Spot both at an early stage (Early Scorch) and late stage (Late Scorch) on the variety of leaves. The proposed approach is divided into two phases, in the first phase, it identifies one or more disease/diseases existing on leaves. In the second phase, amount of area affected by the disease/diseases is calculated. The experimental results obtained showed 97% accuracy using the proposed approach.

Precise Localization of 28 nm via Chain Resistive Defect Using EBAC and Nanoprobing

2012 ◽  
Author(s):  
P. Larré ◽  
H. Tupin ◽  
C. Charles ◽  
R.H. Newton ◽  
A. Reverdy
Keyword(s):  
Electron Beam ◽  
Failure Analysis ◽  
Test Structure ◽  
Precise Localization ◽  
Isolation Method ◽  
Accurate Detection ◽  
Conventional Methods ◽  
Technology Nodes ◽  
Tem Lamella

Abstract As technology nodes continue to shrink, resistive opens have become increasingly difficult to detect using conventional methods such as AVC and PVC. The failure isolation method, Electron Beam Absorbed Current (EBAC) Imaging has recently become the preferred method in failure analysis labs for fast and highly accurate detection of resistive opens and shorts on a number of structures. This paper presents a case study using a two nanoprobe EBAC technique on a 28nm node test structure. This technique pinpointed the fail and allowed direct TEM lamella.

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