Second‐order charge‐sampling structure utilising passive scheme to implement complex conjugate poles

2016 ◽  
Vol 52 (12) ◽  
pp. 1015-1016
Author(s):  
Z. Sohrabi ◽  
A. Jannesari
Keyword(s):  
Second Order ◽  
Complex Conjugate ◽  
Charge Sampling ◽  
Sampling Structure

The Optimum Response of Second-Order, Velocity-Controlled Systems With Contactor Control

1961 ◽  
Vol 83 (1) ◽  
pp. 59-64 ◽  
Author(s):  
Irmgard Flu¨gge-Lotz ◽  
Mih Yin
Keyword(s):  
Three Dimensional ◽  
Second Order ◽  
Complex Conjugate ◽  
Phase Point ◽  
Velocity Control ◽  
Optimum Trajectory ◽  
Controlled Systems ◽  
Dimensional Phase Space ◽  
Constant Coefficients ◽  
Optimum Response

This paper is concerned with the optimum control problem for plants described by second-order differential equations with constant coefficients and with velocity control. Emphasis is placed on the case where the characteristic equation of the system has one zero root and two complex conjugate roots. The problem is studied in terms of the motion of the phase point in a three-dimensional phase space. An iteration method is developed to obtain the optimum trajectory, which in turn gives the optimum response.

scholarly journals Filtering Method Based on Symmetrical Second Order Systems

Symmetry ◽  
2019 ◽  
Vol 11 (6) ◽  
pp. 813
Author(s):  
Cristian Toma
Keyword(s):  
Time Moment ◽  
Sampling Procedure ◽  
Second Order ◽  
Sampling Time ◽  
Half Period ◽  
Order System ◽  
Filtering Method ◽  
Oscillating Systems ◽  
Sampling Structure ◽  
Second Order Systems

This study presents a filtering and sampling structure based on symmetrical second order systems working on half-period. It is shown that undamped second order oscillating systems working on half-period could provide: (i) a large attenuation coefficient for an alternating signal (due to the filtering second order system), and (ii) a robust sampling procedure (the slope of the generated output being zero at the sampling time moment). Unlike previous studies on the same topics, these results are achieved without the use of an additional integrator.

Disappearance Voltage Determinations Using a Convergent Beam

1971 ◽  
Vol 29 ◽  
pp. 184-185
Author(s):  
W. L. Bell
Keyword(s):  
Second Order ◽  
Objective Method ◽  
Uniform Thickness ◽  
Rocking Curve ◽  
Crystal Perfection ◽  
Kikuchi Line ◽  
Central Maximum ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

Sign in / Sign up

Export Citation Format

Share Document