Fully packaged millimetre‐wave dielectric waveguide with multimodal excitation

2015 ◽  
Vol 51 (17) ◽  
pp. 1339-1341 ◽  
Author(s):  
N. Dolatsha ◽  
N. Saiz ◽  
A. Arbabian
1982 ◽  
Vol 52 (11-12) ◽  
pp. 522 ◽  
Author(s):  
R.V. Gelsthorpe ◽  
N. Williams ◽  
N.M. Davey

1997 ◽  
Vol 90 (3) ◽  
pp. 495-497
Author(s):  
CLAUDIO ESPOSTI ◽  
FILIPPO TAMASSIA ◽  
CRISTINA PUZZARINI ◽  
RICCARDO TARRONI ◽  
ZDENEK ZELINGER

1997 ◽  
Vol 92 (2) ◽  
pp. 229-236 ◽  
Author(s):  
M. HEPP ◽  
R. GENDRIESCH ◽  
I. PAK ◽  
Y.A. KURITSYN ◽  
F. LEWEN ◽  
...  

1989 ◽  
Vol 136 (6) ◽  
pp. 487
Author(s):  
S.T. Peng ◽  
S.J. Xu ◽  
F.K. Schwering
Keyword(s):  

2003 ◽  
Vol 783 ◽  
Author(s):  
Charles E Free

This paper discusses the techniques that are available for characterising circuit materials at microwave and millimetre wave frequencies. In particular, the paper focuses on a new technique for measuring the loss tangent of substrates at mm-wave frequencies using a circular resonant cavity. The benefits of the new technique are that it is simple, low cost, capable of good accuracy and has the potential to work at high mm-wave frequencies.


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