Impact of low‐frequency noise variability on statistical parameter extraction in ultra‐scaled CMOS devices
2020 ◽
Vol 67
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pp. 2093-2099
HEMTs for low-power and low-frequency noise 4.2 K cryoelectronics : fabrication and characterization
1998 ◽
Vol 08
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pp. Pr3-131-Pr3-134
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Keyword(s):
Keyword(s):
1999 ◽
2002 ◽
Keyword(s):
Keyword(s):