Low-frequency noise parameter extraction in poly-Si thin-film transistors

2005 ◽  
Author(s):  
Hyungdo Nam ◽  
Hae-Suk Yang ◽  
Jungil Lee ◽  
Alain Chovet ◽  
Bela Szentpali ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Parameter Extraction ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Parameter ◽  
Si Thin Film

Low frequency noise in amorphous silicon thin film transistors with SiNx gate dielectric

2009 ◽  
Vol 105 (12) ◽  
pp. 124504 ◽  
Author(s):  
S. L. Rumyantsev ◽  
Sung Hun Jin ◽  
M. S. Shur ◽  
Mun-Soo Park
Keyword(s):  
Thin Film ◽  
Amorphous Silicon ◽  
Thin Film Transistors ◽  
Gate Dielectric ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Silicon Thin Film

scholarly journals Numerical simulations of conduction and low-frequency noise in polysilicon thin film transistors

2007 ◽  
Vol 515 (19) ◽  
pp. 7556-7559 ◽  
Author(s):  
A. Boukhenoufa ◽  
C. Cordier ◽  
L. Pichon ◽  
B. Cretu
Keyword(s):  
Thin Film ◽  
Numerical Simulations ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise

Negative gate bias stress effects on conduction and low frequency noise characteristics in p-type poly-Si thin-film transistors

2019 ◽  
Vol 28 (8) ◽  
pp. 088502
Author(s):  
Chao-Yang Han ◽  
Yuan Liu ◽  
Yu-Rong Liu ◽  
Ya-Yi Chen ◽  
Li Wang ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Gate Bias ◽  
Stress Effects ◽  
Bias Stress ◽  
Noise Characteristics ◽  
P Type ◽  
Si Thin Film
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