Space-charge accumulation and band bending at conductive P3HT/PDIF-CN2 interfaces investigated by Scanning-Kelvin Probe Microscopy

2021 ◽  
Author(s):  
Federico Chianese ◽  
Sandra Fusco ◽  
Mario Barra ◽  
Fabio Chiarella ◽  
Antonio CARELLA ◽  
...  
Keyword(s):  
Charge Transfer ◽  
Charge Density ◽  
Space Charge ◽  
Charge Accumulation ◽  
Kelvin Probe ◽  
Band Bending ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Transfer Processes ◽  
Scanning Kelvin Probe

Charge transfer processes and space charge accumulation phenomena are fundamental topics concerning the technological applications of organic heterointerfaces. The possibility to achieve localized regions with enhanced charge density is, indeed,...

scholarly journals Correction: Space-charge accumulation and band bending at conductive P3HT/PDIF-CN2 interfaces investigated by scanning-Kelvin probe microscopy

2021 ◽  
Author(s):  
Federico Chianese ◽  
Sandra Fusco ◽  
Mario Barra ◽  
Fabio Chiarella ◽  
Antonio Carella ◽  
...  
Keyword(s):  
Space Charge ◽  
Charge Accumulation ◽  
Kelvin Probe ◽  
Band Bending ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Scanning Kelvin Probe

Correction for ‘Space-charge accumulation and band bending at conductive P3HT/PDIF-CN2 interfaces investigated by scanning-Kelvin probe microscopy’ by Federico Chianese et al., J. Mater. Chem. C, 2021, DOI: 10.1039/d1tc04840f.

scholarly journals Surface band bending of a-plane GaN studied by scanning Kelvin probe microscopy

2006 ◽  
Vol 88 (12) ◽  
pp. 122104 ◽  
Author(s):  
S. Chevtchenko ◽  
X. Ni ◽  
Q. Fan ◽  
A. A. Baski ◽  
H. Morkoç
Keyword(s):  
Kelvin Probe ◽  
Surface Band ◽  
Band Bending ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Scanning Kelvin Probe

Localized charge imaging with scanning Kelvin probe microscopy

2016 ◽  
Vol 28 (2) ◽  
pp. 025703 ◽  
Author(s):  
M F Orihuela ◽  
A M Somoza ◽  
J Colchero ◽  
M Ortuño ◽  
E Palacios-Lidón
Keyword(s):  
Kelvin Probe ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Scanning Kelvin Probe

Quantitative amplitude-modulation scanning Kelvin probe microscopy via the second eigenmode excitation

2021 ◽  
pp. 113399
Author(s):  
Junqi Lai ◽  
Cheng Wang ◽  
Zhiwei Xing ◽  
Shulong Lu ◽  
Qi Chen ◽  
...  
Keyword(s):  
Amplitude Modulation ◽  
Kelvin Probe ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Scanning Kelvin Probe
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