Defect engineering in semiconductor-based SERS
Keyword(s):
Semiconductor-based surface enhanced Raman spectroscopy (SERS) platforms take advantage of the multifaceted tunability of semiconductor materials to realize specialized sensing demands in a wide range of applications. However, until quite...
2002 ◽
Vol 56
(12)
◽
pp. 1524-1530
◽
Keyword(s):
2014 ◽
Vol 2
(26)
◽
pp. 10218
◽
2016 ◽
Vol 09
(06)
◽
pp. 1642003
◽
2000 ◽
Vol 10
(PR8)
◽
pp. Pr8-223
◽
2017 ◽
2012 ◽
Vol 40
(5)
◽
pp. 718
1985 ◽