Efficient Fabrication of MoS2 Nanocomposites by Water-Assisted Exfoliation for Nonvolatile Memories

Green Chemistry ◽

10.1039/d1gc00162k ◽

2021 ◽

Author(s):

Honglei Wang ◽

Pengfei Cheng ◽

Jun Shi ◽

Dong Wang ◽

Hongguang Wang ◽

...

Keyword(s):

Hexagonal Phase ◽

New Method ◽

Nonvolatile Memories

Efficient and green exfoliation of bulk MoS2 into few-layered nanosheets in the semiconducting hexagonal phase (2H-phase) remains a great challenge. Here, we developed a new method, water-assisted exfoliation (WAE), for...

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Selective Sampling and Orientation of Non-Homogeneous Tissues

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100100238 ◽

1968 ◽

Vol 26 ◽

pp. 98-99

Author(s):

C. C. Clawson ◽

L. W. Anderson ◽

R. A. Good

Keyword(s):

Electron Microscopy ◽

Electron Microscope ◽

Light Microscopy ◽

Random Sampling ◽

New Method ◽

Microscope Examination ◽

Small Areas ◽

Selective Sampling ◽

Large Numbers ◽

Specific Orientation

Investigations which require electron microscope examination of a few specific areas of non-homogeneous tissues make random sampling of small blocks an inefficient and unrewarding procedure. Therefore, several investigators have devised methods which allow obtaining sample blocks for electron microscopy from region of tissue previously identified by light microscopy of present here techniques which make possible: 1) sampling tissue for electron microscopy from selected areas previously identified by light microscopy of relatively large pieces of tissue; 2) dehydration and embedding large numbers of individually identified blocks while keeping each one separate; 3) a new method of maintaining specific orientation of blocks during embedding; 4) special light microscopic staining or fluorescent procedures and electron microscopy on immediately adjacent small areas of tissue.

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Electron microscopy study of reactively sputter-deposited Ti/N films on silicon

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100131449 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1362-1363

Author(s):

V. C. Kannan ◽

A. K. Singh ◽

R. B. Irwin ◽

S. Chittipeddi ◽

F. D. Nkansah ◽

...

Keyword(s):

Integrated Circuits ◽

Large Scale ◽

Hexagonal Phase ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Process Conditions ◽

Tin Films ◽

Wide Range ◽

Fcc Phase ◽

Circuits Vlsi

Titanium nitride (TiN) films have historically been used as diffusion barrier between silicon and aluminum, as an adhesion layer for tungsten deposition and as an interconnect material etc. Recently, the role of TiN films as contact barriers in very large scale silicon integrated circuits (VLSI) has been extensively studied. TiN films have resistivities on the order of 20μ Ω-cm which is much lower than that of titanium (nearly 66μ Ω-cm). Deposited TiN films show resistivities which vary from 20 to 100μ Ω-cm depending upon the type of deposition and process conditions. TiNx is known to have a NaCl type crystal structure for a wide range of compositions. Change in color from metallic luster to gold reflects the stabilization of the TiNx (FCC) phase over the close packed Ti(N) hexagonal phase. It was found that TiN (1:1) ideal composition with the FCC (NaCl-type) structure gives the best electrical property.

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A Metastable Crystalline Phase Coexisted with the Decagonal Quasicrystals in Rapidly Solidified Al-Ir Al-Pd and Al-Pt Alloys

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100181622 ◽

1990 ◽

Vol 48 (1) ◽

pp. 572-573

Author(s):

Wang Rong ◽

Ma Lina ◽

K.H. Kuo

Keyword(s):

Metastable Phase ◽

Hexagonal Phase ◽

Icosahedral Quasicrystal ◽

Decagonal Quasicrystal ◽

Decagonal Phase ◽

Decagonal Quasicrystals ◽

Pt Alloy ◽

Pt Alloys ◽

Diffraction Patterns ◽

Rapidly Solidified

Up to now, decagonal quasicrystals have been found in the alloys of whole Al-Pt group metals [1,2]. The present paper is concerned with the TEM study of a hitherto unreported hexagonal phase in rapidly solidified Al-Ir, Al-Pd and Al-Pt alloys.The ribbons of Al5Ir, Al5Pd and Al5Pt were obtained by spun-quenching. Specimens cut from the ribbons were ion thinned and examined in a JEM 100CX electron microscope. In both rapidly solidified Al5Ir and Al5Pd alloys, the decagonal quasicrystal, with rosette or dendritic morphologies can be easily identified by its electron diffraction patterns(EDPs). The EDPs of the decagonal phase for the two alloys are quite similar. However, the existance of decagonal quasicrystal in the Al-Pt alloy has not been verified by our TEM study. It is probably for the reason that the cooling rate is not great enough for the Al5Pt alloy to form the decagonal phase. During the TEM study, a metastable hexagonal phase has been observed in the Al5Ir, Al5Pd and Al5Pt alloys. The lattic parameters calculated from the X-ray powder data of this phase are a=1.229 and c=2.647nm(Al-Pd) and a=1.231 and c=2.623nm(Al-Ir). The composition of this phase was determined by EDS analysis as Al4(Ir, Pd or Pt). It coexists with the decagonal phase in the alloys and transformed to other stable crystalline phases on heating to high temperature. A comparison between the EDPs of the hexagonal and the decagonal phase are shown in Fig.l. Fig. 1(a) is the EDPs of the decagonal phase in various orientions and the EDPs of the hexagonal phase are shown in Fig.1(b), in a similar arrangement as Fig.1(a). It can be clearly seen that the EDPs of the hexagonal phase, especially the distribution of strong spots, are quite similar to their partners of the decagonal quasicrystal in Fig.1(a). All the angles, shown in Fig.l, between two corresponding EDPs are very close to each other. All of these seem strongly to point out that a close structural relationshipexists between these two phases:[110]//d10 [001]//d2(D) //d2 (P)The structure of α-AlFeSi is well known [3] and the 54-atom Mackay icosahedron with double icosahedral shells in the α-AlFeSi structure [4] have been used to model the icosahedral quasicrystal structure. Fig.2(a) and (b) show, respectively, the [110] and [001] projections of the crystal structure of α- AlFeSi, and decagon-pentagons can easily be identified in the former and hexagons in the latter. In addition, the optical transforms of these projections show clearly decagons and hexagons of strong spots, quite similar to those in [110] and [001] EDPs in Fig.1(b). This not only proves the Al(Ir, Pt, Pd) metastable phase being icostructural with the α-AlFeSi phase but also explains the orientation relationship mentioned above.

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