scholarly journals Phase identification of vanadium oxide thin films prepared by atomic layer deposition using X-ray absorption spectroscopy

RSC Advances ◽  
2020 ◽  
Vol 10 (44) ◽  
pp. 26588-26593
Author(s):  
Yejin Kim ◽  
Gwang Yeom Song ◽  
Raju Nandi ◽  
Jae Yu Cho ◽  
Jaeyeong Heo ◽  
...  
Keyword(s):  
Thin Films ◽  
Vanadium Oxide ◽  
Absorption Spectroscopy ◽  
Atomic Layer ◽  
Phase Identification ◽  
X Ray ◽  
Local Structures ◽  
Layer Deposition ◽  
Vanadium Oxide Thin Films ◽  
X Ray Absorption

X-ray absorption spectroscopy reveals the local structures of atomic-layer-deposited vanadium oxide films subject to heat treatments.

X-ray absorption spectroscopy study of the local structures of crystalline Zn–In–Sn oxide thin films

2009 ◽  
Vol 106 (11) ◽  
pp. 113524 ◽  
Author(s):  
D. E. Proffit ◽  
D. B. Buchholz ◽  
R. P. H. Chang ◽  
M. J. Bedzyk ◽  
T. O. Mason ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Spectroscopy Study ◽  
Oxide Thin Films ◽  
X Ray ◽  
Local Structures ◽  
X Ray Absorption

Atomic layer deposition and characterization of vanadium oxide thin films

RSC Advances ◽  
2013 ◽  
Vol 3 (4) ◽  
pp. 1179-1185 ◽  
Author(s):  
Timothee Blanquart ◽  
Jaakko Niinistö ◽  
Marco Gavagnin ◽  
Valentino Longo ◽  
Mikko Heikkilä ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Layer Deposition ◽  
Vanadium Oxide ◽  
Atomic Layer ◽  
Oxide Thin Films ◽  
Layer Deposition ◽  
Vanadium Oxide Thin Films

scholarly journals Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy

2009 ◽  
Vol 42 (6) ◽  
pp. 1158-1164 ◽  
Author(s):  
Narcizo M. Souza-Neto ◽  
Aline Y. Ramos ◽  
Hélio C. N. Tolentino ◽  
Alessandro Martins ◽  
Antonio D. Santos
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Depth Profiling ◽  
Surface Oxidation ◽  
Grazing Incidence ◽  
Incidence Geometry ◽  
X Ray ◽  
Local Structures ◽  
Grazing Incidence Geometry ◽  
X Ray Absorption

A method of using X-ray absorption spectroscopy together with resolved grazing-incidence geometry for depth profiling of atomic, electronic or chemical local structures in thin films is presented. The quantitative deconvolution of thickness-dependent spectral features is performed by fully considering both scattering and absorption formalisms. Surface oxidation and local structural depth profiles in nanometric FePt films are determined, exemplifying the application of the method.

scholarly journals X-ray absorption spectroscopy elucidates the impact of structural disorder on electron mobility in amorphous zinc-tin-oxide thin films

2014 ◽  
Vol 104 (24) ◽  
pp. 242113 ◽  
Author(s):  
Sin Cheng Siah ◽  
Sang Woon Lee ◽  
Yun Seog Lee ◽  
Jaeyeong Heo ◽  
Tomohiro Shibata ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Tin Oxide ◽  
Electron Mobility ◽  
Structural Disorder ◽  
Oxide Thin Films ◽  
X Ray ◽  
Zinc Tin Oxide ◽  
The Impact ◽  
X Ray Absorption
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