scholarly journals Potential of gas-assisted time-of-flight secondary ion mass spectrometry for improving the elemental characterization of complex metal-based systems

2020 ◽  
Vol 35 (12) ◽  
pp. 2997-3006
Author(s):  
Agnieszka Priebe ◽  
Tianle Xie ◽  
Laszlo Pethö ◽  
Johann Michler
Keyword(s):  
Mass Spectrometry ◽  
Chemical Analysis ◽  
Secondary Ion Mass Spectrometry ◽  
High Sensitivity ◽  
Elemental Distribution ◽  
Tof Sims ◽  
Molecular Information ◽  
Secondary Ion ◽  
Elemental Characterization

Enhancing the spatial resolution of TOF-SIMS, which provides 3D elemental distribution in combination with high sensitivity and molecular information, is currently one of the hottest topics in the field of chemical analysis at the nanoscale.

Imaging and 3D Elemental Characterization of Intact Bacterial Spores by High-Resolution Secondary Ion Mass Spectrometry

2008 ◽  
Vol 80 (15) ◽  
pp. 5986-5992 ◽  
Author(s):  
Sutapa Ghosal ◽  
Stewart J. Fallon ◽  
Terrance J. Leighton ◽  
Katherine E. Wheeler ◽  
Michael J. Kristo ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
High Resolution ◽  
Secondary Ion Mass Spectrometry ◽  
Bacterial Spores ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Elemental Characterization
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