scholarly journals Validation of secondary fluorescence excitation in quantitative X-ray fluorescence analysis of thin alloy films

2020 ◽  
Vol 35 (8) ◽  
pp. 1664-1670
Author(s):  
André Wählisch ◽  
Cornelia Streeck ◽  
Philipp Hönicke ◽  
Burkhard Beckhoff
Keyword(s):  
Thin Films ◽  
Fluorescence Analysis ◽  
Fluorescence Excitation ◽  
Alloy Films ◽  
X Ray ◽  
Secondary Fluorescence

Reference-free X-ray fluorescence analysis of multilayered, alloyed thin films in the μm regime with significant secondary fluorescence contributions.

How to Use the Features of Total Reflection of X-Rays for Energy Dispersive XRF

1988 ◽  
Vol 32 ◽  
pp. 105-114 ◽  
Author(s):  
H. Schwenke ◽  
W. Berneike ◽  
J. Knoth ◽  
U. Weisbrod
Keyword(s):  
Thin Films ◽  
Penetration Depth ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
X Rays ◽  
X Ray ◽  
Characteristic Features ◽  
Respective Characteristic ◽  
Nanometer Regime ◽  
Sensitive Method

AbstractThe total reflection of X-rays is mainly determined by three parameters , that is the orltical angle, the reflectivity and the penetration depth. For X-ray fluorescence analysis the respective characteristic features can be exploited in two rather different fields of application. In the analysis of trace elements in samples placed as thin films on optical flats, detection limits as low as 2 pg or 0.05 ppb, respectively, have been obtained. In addition, a penetration depth in the nanometer regime renders Total Reflection XRF an inherently sensitive method for the elemental analysis of surfaces. This paper outlines the main physical and constructional parameters for instrumental design and quantitation in both branches of TXRF.

X-RAY FLUORESCENCE ANALYSIS IN THE DIAGNOSIS OF THYROID CANCER

2017 ◽  
pp. 39-45
Author(s):  
В. Зайчик ◽  
V. Zaychik ◽  
Г. Давыдов ◽  
G. Davydov
Keyword(s):  
Thyroid Cancer ◽  
Normal Tissue ◽  
Thyroid Tissue ◽  
Nodular Goiter ◽  
Fluorescence Analysis ◽  
Fluorescence Excitation ◽  
X Ray ◽  
Thyroid Goiter ◽  
Diagnosis Of Thyroid Cancer

Purpose: To investigate new possibilities of differential diagnosis of benign and malignant thyroid goiter lesions by means of energy dispersive X-ray fluorescence analysis (EDRFA). Material and methods: In the samples of thyroid tissue taken from people with intact thyroid gland (mostly died from trauma, n = 92), as well as in patients with nodular goiter (n = 79) and thyroid cancer (n = 40) bromine (Br), copper (Cu), iron (Fe), iodine (I), rubidium (Rb) and strontium (Sr) were investigated. To determine these elements, the methods of EDRPA have been developed using encapsulated sources with 109Cd and 241Am radionuclides for fluorescence excitation. Results: It is shown that the levels of the content of I, the ratios I / Cu and I / Rb, as well as the products of the ratios I / Cu ∙ (I / Rb) and (I / Br) ∙ (I / Cu) ∙ (I / Rb ) are highly informative markers of thyroid cancer. The accuracy of the developed methods and the reliability of the results obtained were confirmed by measurements of international certified comparison materials. Conclusion: The use of the proposed markers allows in vitro to differentiat thyroid cancer from benign nodes and normal tissue with sensitivity in the range of 86–100 %, specificity of 89–99 %, and accuracy within 90–99 %.

X-Ray Fluorescence Analysis of Multi-Layer Thin Films

1985 ◽  
Vol 29 ◽  
pp. 395-402 ◽  
Author(s):  
T. C. Huang ◽  
W. Parrish
Keyword(s):  
Thin Films ◽  
Single Layer ◽  
Fluorescence Analysis ◽  
Parameter Method ◽  
Fundamental Parameter ◽  
X Ray ◽  
Triple Layer ◽  
Layer Thin Film ◽  
Fundamental Parameter Method

AbstractThe characterization of multi-layer thin films by X-ray fluorescence using the fundamental parameter method and the LAMA-III program is described. Analyses of a double-layer FeMn/NiFe and two triple-layer NiFe/Cu/Cr and Cr/Cu/NiFe specimens show that the complex inter-layer absorption and secondary fluorescence effects were properly corrected. The compositions and thicknesses of all layers agreed to ±2% with corresponding single-layer films, a precisian comparable with bulk and single-layer thin film analyses.

Quantitative X-ray fluorescence analysis of boron in thin films of borophosphosilicate glasses

1988 ◽  
Vol 157 (2) ◽  
pp. 325-336 ◽  
Author(s):  
M. Schuster ◽  
L. Müller ◽  
K.E. Mauser ◽  
R. Straub
Keyword(s):  
Thin Films ◽  
Fluorescence Analysis ◽  
X Ray

scholarly journals Noble Metal Alloy Thin Films by Atomic Layer Deposition & Rapid Joule Heating

2021 ◽  
Author(s):  
Yuanyuan Guo ◽  
Yiming Zou ◽  
Chunyu Cheng ◽  
Leyan Wang ◽  
Riko I Made ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Atomic Layer Deposition ◽  
Joule Heating ◽  
Atomic Layer ◽  
Metal Alloy ◽  
Dynamics Simulation ◽  
Alloy Films ◽  
X Ray ◽  
Layer Deposition

Abstract Metal alloys are usually fabricated by melting constituent metals together or sintering metal alloy particles made by high energy ball milling (mechanical alloying). All these methods only allow for bulk alloys to be formed. This manuscript details a new method of fabricating Rhodium/Iridium (Rh/Ir) metal alloy films using atomic layer deposition (ALD) and rapid Joule heating induced alloying that gives functional thin film alloys, enabling conformal thin films with high aspect ratios on 3D nanostructured substrate. In this work, ALD was used to deposit Rh thin film on an Al2O3 substrate, followed by an Ir overlayer on top of the Rh film. The multilayered structure was then alloyed / sintered using rapid Joule heating. We can precisely control the thickness of the resultant alloy films down to the atomic scale. The Rh@Ir alloy thin films were characterized using scanning and transmission electron microscopy (SEM/TEM) and energy dispersive spectroscopy (EDS) to study their microstructural characteristics. Grazing-incidence X-ray diffraction (GIXRD) and X-ray photoelectron spectroscopy (XPS) were also carried out to confirm the composition and formation of Rh-Ir thin film alloys. All the characterization results reveal that the Rh-Ir alloy thin film was prepared successfully with one single phase and homogeneous distribution of Rh and Ir throughout the film. Molecular Dynamics simulation experiments of Rh/Ir alloys using Large-Scale Atomic/Molecular Massively Parallel Simulator (LAMMPS) were performed to elucidate the alloying mechanism during the rapid heating process, corroborating the experimental results.

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