Speed-dependent adaptive partitioning in QM/MM MD simulations of displacement damage in solid-state systems

Author(s):  
Zenghui Yang

Solids receive displacement damages (DD) when interacting with energetic particles, which may happen during the fabrication of semiconductor devices, in harsh environments and in certain analysis techniques. Simulations of the...

Author(s):  
Charles Zhang ◽  
Matt Thayer ◽  
Lowell Herlinger ◽  
Greg Dabney ◽  
Manuel Gonzalez

Abstract A number of backside analysis techniques rely on the successful use of optical beams in performing backside fault isolation. In this paper, the authors have investigated the influence of the 1340 nm and 1064 nm laser wavelength on advanced CMOS transistor performance.


2018 ◽  
Vol 9 ◽  
pp. 1623-1628 ◽  
Author(s):  
Jonathan Op de Beeck ◽  
Nouha Labyedh ◽  
Alfonso Sepúlveda ◽  
Valentina Spampinato ◽  
Alexis Franquet ◽  
...  

The continuous demand for improved performance in energy storage is driving the evolution of Li-ion battery technology toward emerging battery architectures such as 3D all-solid-state microbatteries (ASB). Being based on solid-state ionic processes in thin films, these new energy storage devices require adequate materials analysis techniques to study ionic and electronic phenomena. This is key to facilitate their commercial introduction. For example, in the case of cathode materials, structural, electrical and chemical information must be probed at the nanoscale and in the same area, to identify the ionic processes occurring inside each individual layer and understand the impact on the entire battery cell. In this work, we pursue this objective by using two well established nanoscale analysis techniques namely conductive atomic force microscopy (C-AFM) and secondary ion mass spectrometry (SIMS). We present a platform to study Li-ion composites with nanometer resolution that allows one to sense a multitude of key characteristics including structural, electrical and chemical information. First, we demonstrate the capability of a biased AFM tip to perform field-induced ionic migration in thin (cathode) films and its diagnosis through the observation of the local resistance change. The latter is ascribed to the internal rearrangement of Li-ions under the effect of a strong and localized electric field. Second, the combination of C-AFM and SIMS is used to correlate electrical conductivity and local chemistry in different cathodes for application in ASB. Finally, a promising starting point towards quantitative electrochemical information starting from C-AFM is indicated.


1993 ◽  
Vol 323 ◽  
Author(s):  
Alan J. Mockler ◽  
Peter J. Goodhew ◽  
Elizabeth A. Logan

AbstractThe microstructure of 95Pb-5Sn flip-chip solder bonds deposited on Cr/Cu/Au metallisation pads has been studied using both light and electron analysis techniques. The presence of Sn-Cu- Au ternary intermetallic phases was detected within the Pb-rich matrix at significant distances from the originally deposited interface. The distribution of the phases present after the solder has undergone a reflow heat treatment can be interpreted using recent equilibrium ternary diagram data. An investigation was also made into the effects of various non-reflow heat treatments at carefully chosen temperatures, to qualitatively evaluate the extent of solid state diffusion and the resultant phase distribution.


2018 ◽  
Vol 14 (11) ◽  
pp. 6002-6014 ◽  
Author(s):  
Sabine Reißer ◽  
Erik Strandberg ◽  
Thomas Steinbrecher ◽  
Marcus Elstner ◽  
Anne S. Ulrich

2009 ◽  
Vol 603 (9) ◽  
pp. 1190-1196 ◽  
Author(s):  
D.P.P. Andrade ◽  
H.M. Boechat-Roberty ◽  
R. Martinez ◽  
M.G.P. Homem ◽  
E.F. da Silveira ◽  
...  

2011 ◽  
Vol 40 (4) ◽  
pp. 529-543 ◽  
Author(s):  
Dorit Grasnick ◽  
Ulrich Sternberg ◽  
Erik Strandberg ◽  
Parvesh Wadhwani ◽  
Anne S. Ulrich

2015 ◽  
Vol 142 (4) ◽  
pp. 044905 ◽  
Author(s):  
Tiago Mendes Ferreira ◽  
O. H. Samuli Ollila ◽  
Roberta Pigliapochi ◽  
Aleksandra P. Dabkowska ◽  
Daniel Topgaard

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