Comment on “Extent of conjugation in diazonium-derived layers in molecular junction devices determined by experiment and modelling” by C. Van Dyck, A. J. Bergren, V. Mukundan, J. A. Fereiro and G. A. DiLabio, Phys. Chem. Chem. Phys., 2019, 21, 16762

2020 ◽  
Vol 22 (37) ◽  
pp. 21543-21546
Author(s):  
Richard L. McCreery ◽  
Shailendra K. Saxena ◽  
Mustafa Supur ◽  
Ushula M. Tefashe
Keyword(s):  
Sampling Error ◽  
Electronic Devices ◽  
Chem Phys ◽  
Scanning Tunnelling Microscopy ◽  
Molecular Junction ◽  
Carbon Electrode ◽  
Molecular Electronic ◽  
Scanning Tunnelling ◽  
Tunnelling Microscopy ◽  
Phys Chem Chem Phys

Misinterpretation of scanning tunnelling microscopy results and sampling error yielded incorrect conclusions about the flatness of a carbon electrode substrate used for molecular electronic devices.

Insights into electrocatalysis by scanning tunnelling microscopy

2021 ◽  
Author(s):  
Xiang Wang ◽  
Yu-Qi Wang ◽  
Ya-Chen Feng ◽  
Dong Wang ◽  
Li-Jun Wan
Keyword(s):  
Scanning Tunnelling Microscopy ◽  
Surface Processes ◽  
Scanning Tunnelling ◽  
Tunnelling Microscopy ◽  
Electrocatalytic Reactions

This review summarizes the applications of scanning tunnelling microscopy in electrocatalysis, including the investigation of the electrocatalyst structures and the surface processes related to electrocatalytic reactions.

scholarly journals Scanning Tunnelling Microscopy of Suspended Graphene

2012 ◽  
Vol 371 ◽  
pp. 012070 ◽  
Author(s):  
R Zan ◽  
U Bangert ◽  
C Muryn ◽  
P Mattocks ◽  
B Hamilton ◽  
...  
Keyword(s):  
Scanning Tunnelling Microscopy ◽  
Suspended Graphene ◽  
Scanning Tunnelling ◽  
Tunnelling Microscopy

Defect Structure of Ultrathin Ceria Films on Pt(111): Atomic Views from Scanning Tunnelling Microscopy

2010 ◽  
Vol 114 (40) ◽  
pp. 17036-17041 ◽  
Author(s):  
David C. Grinter ◽  
Roslinda Ithnin ◽  
Chi L. Pang ◽  
Geoff Thornton
Keyword(s):  
Defect Structure ◽  
Scanning Tunnelling Microscopy ◽  
Scanning Tunnelling ◽  
Tunnelling Microscopy

Scanning tunnelling microscopy on the growth and structure of NiO(100) and CoO(100) thin films

1999 ◽  
Vol 114 ◽  
pp. 129-140 ◽  
Author(s):  
Ina Sebastian ◽  
Thomas Bertrams ◽  
Klaus Meinel ◽  
Henning Neddermeyer
Keyword(s):  
Thin Films ◽  
Scanning Tunnelling Microscopy ◽  
Scanning Tunnelling ◽  
Tunnelling Microscopy

Calculation of scanning tunnelling microscopy images for Kr/graphite system

2003 ◽  
Vol 12 (9) ◽  
pp. 1011-1015 ◽  
Author(s):  
Zhou Xiao-Lin ◽  
Chen Xiang-Rong ◽  
Yang Xiang-Dong ◽  
Gou Qing-Quan
Keyword(s):  
Scanning Tunnelling Microscopy ◽  
Scanning Tunnelling ◽  
Tunnelling Microscopy ◽  
Microscopy Images
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