scholarly journals Operando probing of Li-insertion into LiMn2O4 cathodes by spectroscopic ellipsometry

2020 ◽  
Vol 8 (23) ◽  
pp. 11538-11544 ◽  
Author(s):  
A. Morata ◽  
V. Siller ◽  
F. Chiabrera ◽  
M. Nuñez ◽  
R. Trocoli ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Spectroscopic Ellipsometry ◽  
High Spatial Resolution ◽  
Time Resolved ◽  
Battery Materials ◽  
Limn2o4 Cathodes

A novel operando spectroscopic ellipsometry tool for the characterization of battery materials that combines high spatial resolution with multi-layer and time-resolved capabilities.

Characterization and Control of Copper CMP with Optoacoustic Metrology

2001 ◽  
Vol 671 ◽  
Author(s):  
Michael Gostein ◽  
Paul Lefevre ◽  
Alex A. Maznev ◽  
Michael Joffe
Keyword(s):  
Film Thickness ◽  
Spatial Resolution ◽  
Chemical Mechanical Polishing ◽  
High Spatial Resolution ◽  
Mechanical Polishing ◽  
Length Measurement ◽  
And Control ◽  
Non Destructive

ABSTRACTWe discuss applications of optoacoustic film thickness metrology for characterization of copper chemical-mechanical polishing (CMP). We highlight areas where the use of optoacoustics for CMP characterization provides data complementary to that obtained by other techniques because of its ability to directly measure film thickness with high spatial resolution in a rapid, non-destructive manner. Examples considered include determination of planarization length, measurement of film thickness at intermediate stages of polish, and measurement of arrays of metal lines.

Characterization of silicon dioxide film by high spatial resolution cathodoluminescence spectroscopy

2002 ◽  
Vol 92 (12) ◽  
pp. 7153-7156 ◽  
Author(s):  
M. Yoshikawa ◽  
K. Matsuda ◽  
Y. Yamaguchi ◽  
T. Matsunobe ◽  
Y. Nagasawa ◽  
...  
Keyword(s):  
Silicon Dioxide ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Silicon Dioxide Film ◽  
Cathodoluminescence Spectroscopy ◽  
Dioxide Film

Characterization of defects in ceramics by computerized tomography with high spatial resolution

1994 ◽  
Vol 27 (2) ◽  
pp. 101-102
Author(s):  
B. Illerhaus ◽  
J. Goebbels ◽  
H. Heidt ◽  
W. Muller ◽  
Y. Onel ◽  
...  
Keyword(s):  
Computerized Tomography ◽  
Spatial Resolution ◽  
High Spatial Resolution

Design and Characterization of a Real Time, Large Area, High Spatial Resolution Particle Tracker Based on Scintillating Fibers

2013 ◽  
pp. 159-174 ◽  
Author(s):  
D. Lo Presti ◽  
D. L. Bonanno ◽  
F. Longhitano ◽  
C. Pugliatti ◽  
S. Aiello ◽  
...  
Keyword(s):  
Real Time ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Large Area ◽  
Scintillating Fibers

Characterization of V-Defects in InGaN Single-Quantum-Well Films at Nanometer Level by High Spatial Resolution Cathodoluminescence Spectroscopy

2008 ◽  
Vol 600-603 ◽  
pp. 1305-1308
Author(s):  
Masanobu Yoshikawa ◽  
Masataka Murakami ◽  
Takaya Fujita ◽  
K. Inoue ◽  
K. Matsuda ◽  
...  
Keyword(s):  
Quantum Well ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Spectral Variation ◽  
Single Quantum ◽  
Single Quantum Well ◽  
Cathodoluminescence Spectroscopy

We have measured cathodoluminescence (CL) spectra in the vicinity of V-defects in InGaN single-quantum-well(SQW) films at nanometer level, using newly developed CL apparatus (SE-SEM-CL). From spectroscopic CL measurement, it has been found that the spectra change dramatically in the vicinity of V-defects in the region of £50nm. The SE-SEM-CL has a potential to detect the CL spectral variation at spatial resolution with £50nm.

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