scholarly journals Efficiency-enhanced and sidelobe-suppressed super-oscillatory lenses for sub-diffraction-limit fluorescence imaging with ultralong working distance

Nanoscale ◽  
2020 ◽  
Vol 12 (13) ◽  
pp. 7063-7071 ◽  
Author(s):  
Wenli Li ◽  
Pei He ◽  
Weizheng Yuan ◽  
Yiting Yu
Keyword(s):  
Fluorescence Imaging ◽  
Diffraction Limit ◽  
Working Distance

Customized efficiency-enhanced and sidelobe-suppressed super-oscillatory lenses for sub-diffraction-limit fluorescence imaging with ultralong working distances without photobleaching and a pinhole filter.

scholarly journals SOFIevaluator: a strategy for the quantitative quality assessment of SOFI data

2019 ◽  
Author(s):  
Benjamien Moeyaert ◽  
Wim Vandenberg ◽  
Peter Dedecker
Keyword(s):  
Fluorescence Imaging ◽  
Computational Analysis ◽  
Fluorescent Proteins ◽  
Imaging Techniques ◽  
Super Resolution ◽  
Diffraction Limit ◽  
Imaging Data ◽  
Sample Structure ◽  
Imaging Conditions

AbstractSuper-resolution fluorescence imaging techniques allow optical imaging of specimens beyond the diffraction limit of light. Super-resolution optical fluctuation imaging (SOFI) relies on computational analysis of stochastic blinking events to obtain a super-resolved image. As with some other super-resolution methods, this strong dependency on computational analysis can make it difficult to gauge how well the resulting images reflect the underlying sample structure. We herein report SOFIevaluator, an unbiased and parameter-free algorithm for calculating a set of metrics that describes the quality of super-resolution fluorescence imaging data for SOFI. We additionally demonstrate how SOFIevaluator can be used to identify fluorescent proteins that perform well for SOFI imaging under different imaging conditions.

scholarly journals Superaufgelöste Mikroskopie: Pilze unter Beobachtung

BIOspektrum ◽  
2021 ◽  
Vol 27 (4) ◽  
pp. 380-382
Author(s):  
Sebastian Sputh ◽  
Sabine Panzer ◽  
Christian Stigloher ◽  
Ulrich Terpitz
Keyword(s):  
Electron Microscopy ◽  
Membrane Protein ◽  
Fluorescence Imaging ◽  
Filamentous Fungus ◽  
Light And Electron Microscopy ◽  
Super Resolution ◽  
Diffraction Limit ◽  
Fusarium Fujikuroi ◽  
Structured Illumination ◽  
Structured Illumination Microscopy

AbstractThe diffraction limit of light confines fluorescence imaging of subcellular structures in fungi. Different super-resolution methods are available for the analysis of fungi that we briefly discuss. We exploit the filamentous fungus Fusarium fujikuroi expressing a YFP-labeled membrane protein showing the benefit of correlative light- and electron microscopy (CLEM), that combines structured illumination microscopy (SIM) and scanning election microscopy (SEM).

scholarly journals Adapting the 3D-printed Openflexure microscope enables computational super-resolution imaging

F1000Research ◽  
2019 ◽  
Vol 8 ◽  
pp. 2003
Author(s):  
Stephen D. Grant ◽  
Gemma S. Cairns ◽  
Jordan Wistuba ◽  
Brian R. Patton
Keyword(s):  
Fluorescence Imaging ◽  
Low Cost ◽  
Super Resolution ◽  
Diffraction Limit ◽  
Entire System ◽  
3D Printed ◽  
Resolution Imaging ◽  
Cost Components ◽  
Better Than

We report on a 3D printed microscope, based on a design by the Openflexure project, that uses low cost components to perform fluorescence imaging. The system is sufficiently sensitive and mechanically stable to allow the use of the Super Resolution Radial Fluctuations algorithm to obtain images with resolution better than the diffraction limit. Due to the low-cost components, the entire system can be built for approximately $1200.

High Precision Tool Cutting Edge Monitoring Using Laser Diffraction for On-Machine Measurement

2012 ◽  
Vol 6 (2) ◽  
pp. 163-167 ◽  
Author(s):  
Panart Khajornrungruang ◽  
◽  
Keiichi Kimura ◽  
Yasuhiro Takaya ◽  
Keisuke Suzuki ◽  
...  
Keyword(s):  
High Precision ◽  
Laser Light ◽  
Laser Diffraction ◽  
Diffraction Limit ◽  
Cutting Edge ◽  
Optical Diffraction ◽  
Diffraction Phenomenon ◽  
Working Distance ◽  
Measuring Tool ◽  
Tool Cutting

The Far-field laser diffraction is proposed for measuring tool cutting-edges geometry with sub-micrometer precision. In particular, by eliciting an optical diffraction phenomenon, the cutting-edge of the tool can be monitored without a diffraction limit. This method can also be applied for on-machine measurements because of the simplicity and long working distance of the optical system; high precision can be achieved by using a laser light and there is no need for a vacuum environment. In this study, an on-machine tool measurement device using laser diffraction was developed to experimentally measure tool displacements of order of hundreds of nanometers; a piezo-drive stage was also used. Measurements of the cutting-edge curve of a ball endmill and a tool cutting-edge tolerance were also experimentally monitored.

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