Metallic filamentary conduction in valence change-based resistive switching devices: the case of TaOx thin film with x ∼ 1
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A detailed study of the electrical transport in TaOx thin films with x ∼ 1 provides an insight into the conduction in conductive filaments inside Ta2O5-based resistive switching devices.
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2015 ◽
Vol 3
(40)
◽
pp. 10349-10361
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