scholarly journals Single shot laser ablation MC-ICP-MS for depth profile analysis of U isotopes in UO2 single crystals

2019 ◽  
Vol 34 (10) ◽  
pp. 1965-1974 ◽  
Author(s):  
M. Krachler ◽  
A. Bulgheroni ◽  
A. I. Martinez Ferri ◽  
Y. Ma ◽  
A. Miard ◽  
...  
Keyword(s):  
Single Crystals ◽  
Laser Scanning ◽  
Focused Ion Beam ◽  
Profile Analysis ◽  
Ion Beam ◽  
Depth Profiling ◽  
Confocal Laser ◽  
Single Shot ◽  
Dual Beam ◽  
Icp Ms

Depth profiling of the n(235U)/n(238U) amount ratio in UO2 single crystals employing LA-MC-ICP-MS, a dual beam focused ion beam and confocal laser scanning profilometry.

scholarly journals Imaging and Documenting Gammarideans

2011 ◽  
Vol 2011 ◽  
pp. 1-9 ◽  
Author(s):  
Carolin Haug ◽  
Gerd Mayer ◽  
Verena Kutschera ◽  
Dieter Waloszek ◽  
Andreas Maas ◽  
...  
Keyword(s):  
Laser Scanning ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Polarized Light ◽  
Laser Scanning Microscopy ◽  
Confocal Laser ◽  
High Tech ◽  
Advantages And Disadvantages ◽  
Computed Microtomography ◽  
Document Structures

We give an overview of available techniques for imaging and documenting applied to gammarideans and discuss their advantages and disadvantages. Although recent techniques, such as confocal laser scanning microscopy (cLSM), focused ion beam scanning electron microscopy (FIB SEM), or computed microtomography (μCT), provide new possibilities to detect and document structures, these high-tech devices are expensive, and access to them is often limited. Alternatively, there are many possibilities to enhance the capabilities of established techniques such as macrophotography and light microscopy. We discuss improvements of the illumination with polarized light and the possibilities of utilizing the autofluorescence of animals such as the gammarideans. In addition, we present software-based enhancing tools such as image fusion and image stitching.

scholarly journals Cyanobacterial calcification in modern microbialites at the submicrometer-scale

2013 ◽  
Vol 10 (2) ◽  
pp. 3311-3339 ◽  
Author(s):  
E. Couradeau ◽  
K. Benzerara ◽  
E. Gérard ◽  
I. Estève ◽  
D. Moreira ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Cell Morphology ◽  
Laser Scanning ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Laser Scanning Microscopy ◽  
Confocal Laser ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Advanced Stages

Abstract. The search for microfossils in the geological record has been a long-term challenge. Part of the problem comes from the difficulty of identifying such microfossils unambiguously, since they can be morphologically confused with abiotic biomorphs. One route to improve our ability to correctly identify microfossils consists in studying fossilization processes affecting bacteria in modern settings. We studied the initial stages of fossilization of cyanobacterial cells in modern microbialites from Lake Alchichica (Mexico), a Mg-rich hyperalkaline crater lake (pH 8.9) hosting currently growing stromatolites composed of aragonite [CaCO3] and hydromagnesite [Mg5(CO3)4(OH)2 × 4(H2O)]. Most of the biomass associated with the microbialites is composed of cyanobacteria. Scanning electron microscopy analyses coupled with confocal laser scanning microscopy observations were conducted to co-localize cyanobacterial cells and associated minerals. These observations showed that cyanobacterial cells affiliating to the order Pleurocapsales become specifically encrusted within aragonite with an apparent preservation of cell morphology. Encrustation gradients from non-encrusted to totally encrusted cells spanning distances of a few hundred micrometers were observed. Cells exhibiting increased levels of encrustation along this gradient were studied down to the nm-scale using a combination of focused ion beam (FIB) milling, transmission electron microscopy (TEM) and scanning transmission X-ray microscopy (STXM) at the C, O and N K-edges. Two different types of aragonite crystals were observed: one type was composed of needle-shaped nano-crystals growing outward from the cell body with a crystallographic orientation perpendicular to the cell wall, and another type was composed of larger crystals that progressively filled the cell interior. Organic matter (OM), initially co-localized with the cell, decreased in concentration and dispersed away from the cell while crystal growth occurred. As encrustation developed, OM progressively disappeared, but remaining OM showed the same spectroscopic signature. In the most advanced stages of fossilization, only the textural organization of the two types of aragonite recorded the initial cell morphology and spatial distribution.

scholarly journals Cyanobacterial calcification in modern microbialites at the submicrometer scale

2013 ◽  
Vol 10 (8) ◽  
pp. 5255-5266 ◽  
Author(s):  
E. Couradeau ◽  
K. Benzerara ◽  
E. Gérard ◽  
I. Estève ◽  
D. Moreira ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Cell Morphology ◽  
Laser Scanning ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Laser Scanning Microscopy ◽  
Confocal Laser ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Advanced Stages

Abstract. The search for microfossils in the geological record has been a long-term challenge. Part of the problem comes from the difficulty of identifying such microfossils unambiguously, since they can be morphologically confused with abiotic biomorphs. One route to improve our ability to correctly identify microfossils involves studying fossilization processes affecting bacteria in modern settings. We studied the initial stages of fossilization of cyanobacterial cells in modern microbialites from Lake Alchichica (Mexico), a Mg-rich hyperalkaline crater lake (pH 8.9) hosting currently growing stromatolites composed of aragonite [CaCO3] and hydromagnesite [Mg5(CO3)4(OH)2 · 4(H2O)]. Most of the biomass associated with the microbialites is composed of cyanobacteria. Scanning electron microscopy analyses coupled with confocal laser scanning microscopy observations were conducted to co-localize cyanobacterial cells and associated minerals. These observations showed that cyanobacterial cells affiliated with the order Pleurocapsales become specifically encrusted within aragonite with an apparent preservation of cell morphology. Encrustation gradients from non-encrusted to totally encrusted cells spanning distances of a few hundred micrometers were observed. Cells exhibiting increased levels of encrustation along this gradient were studied down to the nm scale using a combination of focused ion beam (FIB) milling, transmission electron microscopy (TEM) and scanning transmission x-ray microscopy (STXM) at the C, O and N K-edges. Two different types of aragonite crystals were observed: one type was composed of needle-shaped nano-crystals growing outward from the cell body with a crystallographic orientation perpendicular to the cell wall, and another type was composed of larger crystals that progressively filled the cell interior. Exopolymeric substances (EPS), initially co-localized with the cells, decreased in concentration and dispersed away from the cells while crystal growth occurred. As encrustation developed, EPS progressively disappeared, but remaining EPS showed the same spectroscopic signature. In the most advanced stages of fossilization, only the textural organization of the two types of aragonite recorded the initial cell morphology and spatial distribution.

Nanofibrillated cellulose as a coating agent to improve print quality of synthetic fiber sheets

TAPPI Journal ◽  
2010 ◽  
Vol 9 (11) ◽  
pp. 25-29 ◽  
Author(s):  
HITOMI HAMADA ◽  
DOUGLAS W. BOUSFIELD
Keyword(s):  
Laser Scanning ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Nanofibrillated Cellulose ◽  
Confocal Laser Scanning Microscope ◽  
Synthetic Fiber ◽  
Confocal Laser ◽  
Print Quality ◽  
Physical Treatment ◽  
Coating Agent

To determine the potential of nanofibrillated cellulose (NFC) for use as a coating material, we studied the characteristics of several NFC-coated samples on a synthetic fiber sheet. We used two water-based printing methods to characterize the change in print quality and prepared two types of NFC by two different physical treatment methods. Various coat weights were applied onto synthetic fiber sheets, and the printability of the coated sheets was evaluated by ink absorption rates and print density. Ink pigment penetration was characterized with a confocal laser scanning microscope and a scanning electron microscope, with chemical analysis of samples using focused ion beam. The contact angle and the ink penetration rates decreased with increased coat weight of NFC. This result is the opposite of what the Lucas-Washburn equation would predict. For pigment-based flexographic inks, ink pigments were captured at the NFC layer. For dye-based inks, the ink components penetrated and moved through the NFC-coated layer. For ink-jet printing, the print quality improved with the NFC coating.

Fast Turn-around Failure Analysis of Metal Interconnection Using FIB and LA ICP-MS

2010 ◽  
Author(s):  
Zixiao Pan ◽  
Wei Wei ◽  
Fuhe Li
Keyword(s):  
Failure Analysis ◽  
Inductively Coupled Plasma ◽  
Structural Damage ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Detection Sensitivity ◽  
Chemical Contamination ◽  
Inductively Coupled ◽  
Minimal Sample ◽  
Icp Ms

Abstract This paper introduces our effort in failure analysis of a 200 nm thick metal interconnection on a glass substrate and covered with a passivation layer. Structural damage in localized areas of the metal interconnections was observed with the aid of focused ion beam (FIB) cross-sectioning. Laser ablation inductively coupled plasma mass spectroscopy (LA ICP-MS) was then applied to the problematic areas on the interconnection for chemical survey. LA ICP-MS showed direct evidence of localized chemical contamination, which has likely led to corrosion (or over-etching) of the metal interconnection and the assembly failure. Due to the high detection sensitivity of LA ICP-MS and its compatibility with insulating material analysis, minimal sample preparation is required. As a result, the combination of FIB and LA ICP-MS enabled successful meso-scale failure analysis with fast turnaround and reasonable cost.

To Eliminate Curtain Effect of FIB TEM Samples by a Combination of Sample Dicing and Backside Milling

2014 ◽  
Author(s):  
Jian-Shing Luo ◽  
Hsiu Ting Lee
Keyword(s):  
Sample Preparation ◽  
Focused Ion Beam ◽  
Preparation Method ◽  
Low Cost ◽  
Ion Beam ◽  
Sample Preparation Method ◽  
Site Specific ◽  
Dual Beam ◽  
Transmission Electron

Abstract Several methods are used to invert samples 180 deg in a dual beam focused ion beam (FIB) system for backside milling by a specific in-situ lift out system or stages. However, most of those methods occupied too much time on FIB systems or requires a specific in-situ lift out system. This paper provides a novel transmission electron microscopy (TEM) sample preparation method to eliminate the curtain effect completely by a combination of backside milling and sample dicing with low cost and less FIB time. The procedures of the TEM pre-thinned sample preparation method using a combination of sample dicing and backside milling are described step by step. From the analysis results, the method has applied successfully to eliminate the curtain effect of dual beam FIB TEM samples for both random and site specific addresses.

Manufacturing In-Line Whole Wafer Focused Ion Beam (FIB) Memory Address Descramble Verification

2008 ◽  
Author(s):  
Steven B. Herschbein ◽  
Hyoung H. Kang ◽  
Scott L. Jansen ◽  
Andrew S. Dalton
Keyword(s):  
Flip Chip ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Random Access ◽  
Cell Counting ◽  
Test Results ◽  
Laboratory Procedure ◽  
Memory Array ◽  
Dual Beam ◽  
Process Level

Abstract Test engineers and failure analyst familiar with random access memory arrays have probably encountered the frustration of dealing with address descrambling. The resulting nonsequential internal bit cell counting scheme often means that the location of the failing cell under investigation is nowhere near where it is expected to be. A logical to physical algorithm for decoding the standard library block might have been provided with the design, but is it still correct now that the array has been halved and inverted to fit the available space in a new processor chip? Off-line labs have traditionally been tasked with array layout verification. In the past, hard and soft failures could be induced on the frontside of finished product, then bitmapped to see if the sites were in agreement. As density tightened, flip-chip FIB techniques to induce a pattern of hard fails on packaged devices came into practice. While the backside FIB edit method is effective, it is complex and expensive. The installation of an in-line Dual Beam FIB created new opportunities to move FA tasks out of the lab and into the FAB. Using a new edit procedure, selected wafers have an extensive pattern of defects 'written' directly into the memory array at an early process level. Bitmapping of the RAM blocks upon wafer completion is then used to verify correlation between the physical damaged cells and the logical sites called out in the test results. This early feedback in-line methodology has worked so well that it has almost entirely displaced the complex laboratory procedure of backside FIB memory array descramble verification.

Ion Beam Imaging Methodology of Invisible Metal under Insulator Using High Energy Electron Beam Charging

2007 ◽  
Author(s):  
C.H. Wang ◽  
S.P. Chang ◽  
C.F. Chang ◽  
J.Y. Chiou
Keyword(s):  
Metal Ion ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Electrical Measurement ◽  
High Energy ◽  
Advanced Technology ◽  
High Energy Electron ◽  
Common Assumption ◽  
Dual Beam ◽  
Imaging Methodology

Abstract Focused ion beam (FIB) is a popular tool for physical failure analysis (FA), especially for circuit repair. FIB is especially useful on advanced technology where the FIB is used to modify the circuit for new layout verification or electrical measurement. The samples are prepared till inter-metal dielectric (IMD), then a hole is dug or a metal is deposited or oxide is deposited by FIB. A common assumption is made that metal under oxide can not be seen by FIB. But a metal ion image is desired for further action. Dual beam, FIB and Scanning Electron Microscope (SEM), tools have a special advantage. When switching back and forth from SEM to FIB the observation has been made that the metal lines can be imaged. The details of this technique will be discussed below.

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