scholarly journals Two-dimensional bimolecular recombination in amorphous organic semiconductors

2020 ◽  
Vol 22 (3) ◽  
pp. 1174-1180
Author(s):  
Sergey Novikov
Keyword(s):  
Charge Carrier ◽  
Organic Semiconductors ◽  
Carrier Density ◽  
Charge Carrier Density ◽  
Two Dimensional ◽  
Spatially Correlated ◽  
Bimolecular Recombination

Two-dimensional recombination in the spatially correlated random landscape demonstrates rich behavior depending on the disorder parameters and charge carrier density.

scholarly journals The Charge Carrier Density Influence and Thermal Effects on Charge Transport in Organic Semiconductors

2015 ◽  
Vol 9 (18) ◽  
pp. 216-218
Author(s):  
Sara S. de Brito ◽  
Wiliam F. da Cunha ◽  
Demétrio A. da Silva Filho ◽  
Pedro H. de Oliveira Neto
Keyword(s):  
Charge Carrier ◽  
Charge Transport ◽  
Organic Semiconductors ◽  
Thermal Effects ◽  
Carrier Density ◽  
Charge Carrier Density

Thermal Frequency Imaging: A New Application of Laser Voltage Imaging Applied on 40nm Technology

2011 ◽  
Author(s):  
Guillaume Celi ◽  
Sylvain Dudit ◽  
Thierry Parrassin ◽  
Philippe Perdu ◽  
Antoine Reverdy ◽  
...  
Keyword(s):  
Charge Carrier ◽  
Laser Beam ◽  
Integrated Circuit ◽  
Carrier Density ◽  
Deep Submicron ◽  
Charge Carrier Density ◽  
Voltage Imaging ◽  
A New Technique ◽  
Scan Chain

Abstract For Very Deep submicron Technologies, techniques based on the analysis of reflected laser beam properties are widely used. The Laser Voltage Imaging (LVI) technique, introduced in 2009, allows mapping frequencies through the backside of integrated circuit. In this paper, we propose a new technique based on the LVI technique to debug a scan chain related issue. We describe the method to use LVI, usually dedicated to frequency mapping of digital active parts, in a way that enables localization of resistive leakage. Origin of this signal is investigated on a 40nm case study. This signal can be properly understood when two different effects, charge carrier density variations (LVI) and thermo reflectance effect (Thermal Frequency Imaging, TFI), are taken into account.

scholarly journals Zn2+ Ion Surface Enrichment in Doped Iron Oxide Nanoparticles Leads to Charge Carrier Density Enhancement

ACS Omega ◽  
2018 ◽  
Vol 3 (11) ◽  
pp. 16328-16337 ◽  
Author(s):  
Stanley Bram ◽  
Matthew N. Gordon ◽  
Michael A. Carbonell ◽  
Maren Pink ◽  
Barry D. Stein ◽  
...  
Keyword(s):  
Iron Oxide ◽  
Charge Carrier ◽  
Iron Oxide Nanoparticles ◽  
Carrier Density ◽  
Oxide Nanoparticles ◽  
Charge Carrier Density ◽  
Surface Enrichment ◽  
Density Enhancement

Tuning of charge carrier density by deposition pressure in Sb-doped Bi2Se3 thin films

2020 ◽  
Vol 693 ◽  
pp. 137689
Author(s):  
S. Abhirami ◽  
Shilpam Sharma ◽  
E.P. Amaladass ◽  
R. Rajitha ◽  
P. Magudapathy ◽  
...  
Keyword(s):  
Thin Films ◽  
Charge Carrier ◽  
Carrier Density ◽  
Charge Carrier Density ◽  
Deposition Pressure
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