scholarly journals Antisolvent processing of lead halide perovskite thin films studied by in situ X-ray diffraction

2018 ◽  
Vol 6 (39) ◽  
pp. 18865-18870 ◽  
Author(s):  
Karsten Bruening ◽  
Christopher J. Tassone
Keyword(s):  
Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Halide Perovskite ◽  
Induced Crystallization ◽  
Lead Halide ◽  
Blade Coating

The conversion mechanism from the precursor ink to the perovskite film using antisolvent-induced crystallization has been studied using in situ X-ray diffraction during blade coating and antisolvent deposition.

Monitoring the Phase Formation of Coevaporated Lead Halide Perovskite Thin Films by in Situ X-ray Diffraction

2014 ◽  
Vol 5 (19) ◽  
pp. 3308-3312 ◽  
Author(s):  
Paul Pistor ◽  
Juliane Borchert ◽  
Wolfgang Fränzel ◽  
René Csuk ◽  
Roland Scheer
Keyword(s):  
Thin Films ◽  
Phase Formation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Halide Perovskite ◽  
Lead Halide

Thermal stability and miscibility of co-evaporated methyl ammonium lead halide (MAPbX3, X = I, Br, Cl) thin films analysed by in situ X-ray diffraction

2018 ◽  
Vol 6 (24) ◽  
pp. 11496-11506 ◽  
Author(s):  
Paul Pistor ◽  
Thomas Burwig ◽  
Carlo Brzuska ◽  
Björn Weber ◽  
Wolfgang Fränzel
Keyword(s):  
Thin Films ◽  
Thermal Stability ◽  
Thermal Treatment ◽  
Phase Evolution ◽  
X Ray Diffraction ◽  
Crystalline Phases ◽  
X Ray ◽  
Subsequent Thermal Treatment ◽  
Lead Halide

We present the identification of crystalline phases by in situ X-ray diffraction during growth and monitor the phase evolution during subsequent thermal treatment of CH3NH3PbX3 (X = I, Br, Cl) perovskite thin films.

Structural investigation of co-evaporated methyl ammonium lead halide perovskite films during growth and thermal decomposition using different PbX2 (X = I, Cl) precursors

2015 ◽  
Vol 3 (39) ◽  
pp. 19842-19849 ◽  
Author(s):  
Juliane Borchert ◽  
Heidi Boht ◽  
Wolfgang Fränzel ◽  
René Csuk ◽  
Roland Scheer ◽  
...  
Keyword(s):  
Thermal Decomposition ◽  
Structural Analysis ◽  
Structural Investigation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Detailed Structural Analysis ◽  
Halide Perovskite ◽  
Lead Halide

Here we present a detailed structural analysis of methylammonium lead halide (I, Cl) films by in situ X-ray diffraction during their growth and thermal recrystallization up to their decomposition.

Combined in Situ Photoluminescence and X-ray Scattering Reveals Defect Formation in Lead-Halide Perovskite Films

2021 ◽  
pp. 10156-10162
Author(s):  
Nada Mrkyvkova ◽  
Vladimír Held ◽  
Peter Nádaždy ◽  
Riyas Subair ◽  
Eva Majkova ◽  
...  
Keyword(s):  
Defect Formation ◽  
X Ray ◽  
X Ray Scattering ◽  
Halide Perovskite ◽  
Lead Halide ◽  
Ray Scattering

Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction

2017 ◽  
Vol 111 (8) ◽  
pp. 082907 ◽  
Author(s):  
Seiji Nakashima ◽  
Osami Sakata ◽  
Hiroshi Funakubo ◽  
Takao Shimizu ◽  
Daichi Ichinose ◽  
...  
Keyword(s):  
Thin Films ◽  
Electric Field ◽  
Lattice Distortion ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Bifeo3 Thin Films

In situ X-ray diffraction study of the controlled oxidation and reduction in the V–O system for the synthesis of VO2 and V2O3 thin films

2015 ◽  
Vol 3 (43) ◽  
pp. 11357-11365 ◽  
Author(s):  
Geert Rampelberg ◽  
Bob De Schutter ◽  
Wouter Devulder ◽  
Koen Martens ◽  
Iuliana Radu ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
Resistance Switching ◽  
X Ray Diffraction ◽  
X Ray

VO2 and V2O3 thin films were prepared during in situ XRD investigation by oxidation and reduction of V and V2O5. Films show up to 5 orders of magnitude resistance switching.

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