scholarly journals Electrical conductivity of silver nanoparticle doped carbon nanofibres measured by CS-AFM

RSC Advances ◽  
2019 ◽  
Vol 9 (8) ◽  
pp. 4553-4562 ◽  
Author(s):  
Wael Ali ◽  
Valbone Shabani ◽  
Matthias Linke ◽  
Sezin Sayin ◽  
Beate Gebert ◽  
...  
Keyword(s):  
Electrical Conductivity ◽  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Silver Nanoparticle ◽  
Carbon Nanofibres ◽  
Force Microscopy ◽  
Atomic Force ◽  
Composite Carbon

In this work, a pioneering study on the electrical properties of composite carbon nanofibres (CNFs) using current-sensitive atomic force microscopy (CS-AFM) has been demonstrated.

The correlation between electrical conductivity and second-order Raman modes of laser-reduced graphene oxide

2019 ◽  
Vol 21 (19) ◽  
pp. 10125-10134 ◽  
Author(s):  
Bing Ma ◽  
Raul D. Rodriguez ◽  
Alexey Ruban ◽  
Sergey Pavlov ◽  
Evgeniya Sheremet
Keyword(s):  
Electrical Conductivity ◽  
Atomic Force Microscopy ◽  
Graphene Oxide ◽  
Electrical Properties ◽  
Reduced Graphene Oxide ◽  
Second Order ◽  
Force Microscopy ◽  
Atomic Force ◽  
Reduced Graphene ◽  
Raman Modes

Second-order Raman modes correlate with the electrical properties of reduced graphene oxide measured at the nanoscale by atomic force microscopy.

Characterization of the Electrical Properties of Nickel-Based CMSX-4 Super-alloys Using Atomic Force Microscopy (AFM)

2004 ◽  
Vol 10 (S02) ◽  
pp. 1102-1103
Author(s):  
Guangchun Cui ◽  
Rosario A Gerhardt
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Force Microscopy ◽  
Atomic Force

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

scholarly journals Insights into dynamic sliding contacts from conductive atomic force microscopy

2020 ◽  
Vol 2 (9) ◽  
pp. 4117-4124
Author(s):  
Nicholas Chan ◽  
Mohammad R. Vazirisereshk ◽  
Ashlie Martini ◽  
Philip Egberts
Keyword(s):  
Electrical Conductivity ◽  
Atomic Force Microscopy ◽  
Sliding Contact ◽  
Current Transport ◽  
Conductive Atomic Force Microscopy ◽  
Sliding Contacts ◽  
Force Microscopy ◽  
Single Asperity ◽  
Atomic Force ◽  
Sliding Dynamics

Measuring the electrical conductivity serves as a proxy for characterizing the nanoscale contact. In this work, the correlation between sliding dynamics and current transport at single asperity sliding contact is investigated.

Annealing effects on the electrical conductivity of polymerized liquid crystalline 3,4-ethylenedioxythiophene derivatives

e-Polymers ◽  
2006 ◽  
Vol 6 (1) ◽  
Author(s):  
Noelle Wrubbel ◽  
Helmut Ritter ◽  
Knud Reuter ◽  
Alexander Karbach ◽  
Doris Drechsler
Keyword(s):  
Electrical Conductivity ◽  
Atomic Force Microscopy ◽  
Liquid Crystal ◽  
Liquid Crystalline ◽  
Electrically Conductive ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Annealing Effects

Abstract3,4-Ethylenedioxythiophene derivatives with aromatic, in most cases mesogenic, side groups were synthesized and their liquid crystal behaviour was characterized. These monomers were polymerized oxidatively to charged, electrically conductive polythiophenes. X-ray and atomic force microscopy studies were performed. Films of theses polythiophenes achieved via in situ polymerization were prone to a significant increase of the conductivity by annealing.

Nanoscale surface electrical properties of zinc oxide films investigated by conducting atomic force microscopy

2007 ◽  
Vol 71 (1) ◽  
pp. 1-4 ◽  
Author(s):  
Chang-Feng Yu ◽  
Sy-Hann Chen ◽  
Wen-Jia Xie ◽  
Yung-Shao Lin ◽  
Cheng-Yu Shen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Zinc Oxide ◽  
Electrical Properties ◽  
Oxide Films ◽  
Force Microscopy ◽  
Zinc Oxide Films ◽  
Atomic Force
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