Nanoscale surface electrical properties of zinc oxide films investigated by conducting atomic force microscopy

Chang-Feng Yu; Sy-Hann Chen; Wen-Jia Xie; Yung-Shao Lin; Cheng-Yu Shen; Sheng-Jhong Tsai; Che-Wei Sung; Chyung Ay

doi:10.1002/jemt.20517

Nanoscale surface electrical properties of zinc oxide films investigated by conducting atomic force microscopy

Microscopy Research and Technique ◽

10.1002/jemt.20517 ◽

2007 ◽

Vol 71 (1) ◽

pp. 1-4 ◽

Cited By ~ 10

Author(s):

Chang-Feng Yu ◽

Sy-Hann Chen ◽

Wen-Jia Xie ◽

Yung-Shao Lin ◽

Cheng-Yu Shen ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Zinc Oxide ◽

Electrical Properties ◽

Oxide Films ◽

Force Microscopy ◽

Zinc Oxide Films ◽

Atomic Force

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An atomic force microscopy study of thin copper oxide films grown by molecular beam epitaxy on MgO(100)

Thin Solid Films ◽

10.1016/0040-6090(96)08574-4 ◽

1996 ◽

Vol 281-282 ◽

pp. 57-59 ◽

Cited By ~ 6

Author(s):

A. Brazdeikis ◽

U.O. Karlsson ◽

A.S. Flodström

Keyword(s):

Atomic Force Microscopy ◽

Molecular Beam Epitaxy ◽

Copper Oxide ◽

Molecular Beam ◽

Oxide Films ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force

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Microwave Atomic Force Microscopy: Quantitative Measurement and Characterization of Electrical Properties on the Nanometer Scale

Applied Physics Express ◽

10.1143/apex.5.016602 ◽

2011 ◽

Vol 5 (1) ◽

pp. 016602 ◽

Cited By ~ 8

Author(s):

Lan Zhang ◽

Yang Ju ◽

Atsushi Hosoi ◽

Akifumi Fujimoto

Keyword(s):

Atomic Force Microscopy ◽

Electrical Properties ◽

Quantitative Measurement ◽

Nanometer Scale ◽

Force Microscopy ◽

Atomic Force

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Using Conductive Atomic Force Microscopy to the Evaluate Electrical Properties of MoS2 nanoparticles for Device Applications

ECS Transactions ◽

10.1149/10403.0017ecst ◽

2021 ◽

Vol 104 (3) ◽

pp. 17-19

Author(s):

Aisha Alhammadi ◽

Wafa Alnaqbi ◽

Juveiriah Ashraf ◽

Ayman Rezk ◽

Ammar Nayfeh

Keyword(s):

Atomic Force Microscopy ◽

Electrical Properties ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Device Applications ◽

Mos2 Nanoparticles

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Improvement in Corrosion Protection of Zinc by A Natural Inhibitor Incorporated with Zinc Oxide Nanoparticles in an Acidic Medium Evaluated using Gravimetric Measurement, Electrochemical Method and Atomic Force Microscopy

Oriental Journal Of Chemistry ◽

10.13005/ojc/320422 ◽

2016 ◽

Vol 32 (4) ◽

pp. 1963-1976

Author(s):

Neha Parekh ◽

Divya Ladha ◽

Poonam Wadhwani ◽

Suresh Kumar ◽

Nisha Shah

Keyword(s):

Atomic Force Microscopy ◽

Zinc Oxide ◽

Zinc Oxide Nanoparticles ◽

Acidic Medium ◽

Electrochemical Method ◽

Oxide Nanoparticles ◽

Gravimetric Measurement ◽

Force Microscopy ◽

Atomic Force ◽

Natural Inhibitor

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Atomic Force Microscopy Study of Grain Evolution during Growth of Thin Oxide Films

Materials Science Forum ◽

10.4028/www.scientific.net/msf.204-206.729 ◽

1996 ◽

Vol 204-206 ◽

pp. 729-734

Author(s):

Frank Czerwinski ◽

Jerzy A. Szpunar

Keyword(s):

Atomic Force Microscopy ◽

Oxide Films ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Thin Oxide Films ◽

Thin Oxide

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Evaluation of band gap energy and surface roughness for tin indium zinc oxide thin films by atomic force microscopy and electron spectroscopy

IOP Conference Series Materials Science and Engineering ◽

10.1088/1757-899x/343/1/012006 ◽

2018 ◽

Vol 343 ◽

pp. 012006

Author(s):

Yus Rama Denny ◽

Teguh Firmansyah ◽

Isnaeni ◽

Sovian Aritonang ◽

AM Kartina

Keyword(s):

Thin Films ◽

Surface Roughness ◽

Atomic Force Microscopy ◽

Zinc Oxide ◽

Electron Spectroscopy ◽

Band Gap Energy ◽

Force Microscopy ◽

Gap Energy ◽

Atomic Force ◽

Indium Zinc Oxide

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Preparation and electrical properties of undoped zinc oxide films by CVD

Journal of Materials Science Letters ◽

10.1007/bf00726543 ◽

1990 ◽

Vol 9 (11) ◽

pp. 1351-1353 ◽

Cited By ~ 45

Author(s):

M. F. Ogawa ◽

Y. Natsume ◽

T. Hirayama ◽

H. Sakata

Keyword(s):

Zinc Oxide ◽

Electrical Properties ◽

Oxide Films ◽

Zinc Oxide Films

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Characterization of the Electrical Properties of Nickel-Based CMSX-4 Super-alloys Using Atomic Force Microscopy (AFM)

Microscopy and Microanalysis ◽

10.1017/s1431927604882291 ◽

2004 ◽

Vol 10 (S02) ◽

pp. 1102-1103

Author(s):

Guangchun Cui ◽

Rosario A Gerhardt

Keyword(s):

Atomic Force Microscopy ◽

Electrical Properties ◽

Force Microscopy ◽

Atomic Force

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

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Force modulation atomic force microscopy: background, development and application to electrodeposited cerium oxide films

Applied Surface Science ◽

10.1016/s0169-4332(97)00590-4 ◽

1998 ◽

Vol 126 (1-2) ◽

pp. 21-33 ◽

Cited By ~ 27

Author(s):

Feng-Bin Li ◽

G.E. Thompson ◽

R.C. Newman

Keyword(s):

Atomic Force Microscopy ◽

Cerium Oxide ◽

Oxide Films ◽

Force Microscopy ◽

Force Modulation ◽

Atomic Force

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Analysis of topographical parameters and interfacial interaction of zinc oxide reinforced poly (vinyl alcohol-g-acrylonitrile) nanocomposite film surfaces using atomic force microscopy

Nano-Structures & Nano-Objects ◽

10.1016/j.nanoso.2019.100308 ◽

2019 ◽

Vol 18 ◽

pp. 100308 ◽

Cited By ~ 11

Author(s):

Shikha Chouhan ◽

Anil K. Bajpai ◽

Rinkesh Bhatt

Keyword(s):

Atomic Force Microscopy ◽

Zinc Oxide ◽

Vinyl Alcohol ◽

Nanocomposite Film ◽

Interfacial Interaction ◽

Poly Vinyl Alcohol ◽

Force Microscopy ◽

Atomic Force

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