Bottom-electrode induced defects in self-assembled monolayer (SAM)-based tunnel junctions affect only the SAM resistance, not the contact resistance or SAM capacitance
Keyword(s):
In large area molecular junctions, defects are always present and can be caused by impurities and/or defects in the electrode materials and/or SAMs, but how they affect the electrical characteristics of junctions has rarely been studied.
2020 ◽
Vol 20
(8)
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pp. 4648-4651
2004 ◽
Vol 82
(2)
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pp. 351-358
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Electron tunneling through alkanedithiol self-assembled monolayers in large-area molecular junctions
2007 ◽
Vol 104
(27)
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pp. 11161-11166
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Keyword(s):
2009 ◽
Vol 473
(1-3)
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pp. 189-192
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Keyword(s):
2014 ◽
Vol 5
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pp. 258-267
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