Identifying the acceptor state in NiO hole collection layers: direct observation of exciton dissociation and interfacial hole transfer across a Fe2O3/NiO heterojunction
2018 ◽
Vol 20
(38)
◽
pp. 24545-24552
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Keyword(s):
Ultrafast XUV reflection–absorption identifies interfacial charge transfer mechanism and the hole acceptor state in a Fe2O3/NiO model heterojunction
2014 ◽
Vol 16
(42)
◽
pp. 23150-23156
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2019 ◽
Vol 368
◽
pp. 345-357
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2017 ◽
Vol 338
◽
pp. 72-84
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2004 ◽
Vol 384
(4-6)
◽
pp. 197-202
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