Polyelectrolyte multilayers under compression: concurrent osmotic stress and colloidal probe atomic force microscopy

Soft Matter ◽  
2018 ◽  
Vol 14 (6) ◽  
pp. 961-968 ◽  
Author(s):  
Bo Wu ◽  
Guangming Liu ◽  
Guangzhao Zhang ◽  
Vincent S. J. Craig
Keyword(s):  
Atomic Force Microscopy ◽  
Osmotic Stress ◽  
Surface Forces ◽  
Polyelectrolyte Multilayers ◽  
Colloidal Probe ◽  
Force Microscopy ◽  
Colloidal Interactions ◽  
Atomic Force

Colloidal interactions have been characterised using both osmotic stress and surface forces.

Colloidal Probe AFM Measurements of the Electrophoretic Force

2006 ◽  
Vol 314 ◽  
pp. 1-6
Author(s):  
Linda Stappers ◽  
Jan Fransaer
Keyword(s):  
Atomic Force Microscopy ◽  
Electric Fields ◽  
Colloidal Probe ◽  
Force Microscopy ◽  
Colloidal Interactions ◽  
Atomic Force ◽  
Cantilever Surface ◽  
Preliminary Study ◽  
High Electric Fields ◽  
Oriented Parallel

Colloidal probe atomic force microscopy is a very useful tool in the study of colloidal interactions. Although this technique has been applied to study interactions between a particle and a polarized electrode during electrodeposition, it has never been used to study interactions in high electric fields as encountered in electrophoretic deposition. In this work, a preliminary study was undertaken to verify whether colloidal probe AFM could be used to measure the electrophoretic force on a particle. It was found that the electrophoretic force could be detected by colloidal probe AFM under certain circumstances. In order to prevent that the contribution of the cantilever on the measurement of the electrophoretic force becomes large, the charge on the cantilever should be small compared to the charge of the particle, which is attached to the cantilever. Moreover, the area of cantilever surface which is oriented parallel to the electric field should be small to minimize the contribution of the cantilever.

Correlation between surface forces and surface reactivity in the setting of plaster by atomic force microscopy

2000 ◽  
Vol 161 (3-4) ◽  
pp. 316-322 ◽  
Author(s):  
Eric Finot ◽  
Eric Lesniewska ◽  
Jean-Pierre Goudonnet ◽  
Jean Claude Mutin
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Reactivity ◽  
Surface Forces ◽  
Force Microscopy ◽  
Atomic Force

Stratification of Colloidal Particles on a Surface: Study by a Colloidal Probe Atomic Force Microscopy Combined with a Transform Theory

2018 ◽  
Vol 122 (16) ◽  
pp. 4592-4599 ◽  
Author(s):  
Ken-ichi Amano ◽  
Taira Ishihara ◽  
Kota Hashimoto ◽  
Naoyuki Ishida ◽  
Kazuhiro Fukami ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Colloidal Particles ◽  
Colloidal Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Study

scholarly journals Measurement of Interaction Forces between Montmorillonite Particles in NaCl Solutions using a Colloidal Probe Atomic Force Microscopy

2006 ◽  
Vol 5 (3) ◽  
pp. 251-256
Author(s):  
Susumu KUROSAWA ◽  
Masashi MIZUKAMI ◽  
Hisao SATO ◽  
Jun NOZAWA ◽  
Keiichi TSUJIMOTO ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Interaction Forces ◽  
Colloidal Probe ◽  
Force Microscopy ◽  
Atomic Force

Investigations of Surface Forces between Gypsum Microcrystals in Air Using Atomic Force Microscopy

Langmuir ◽  
2000 ◽  
Vol 16 (9) ◽  
pp. 4237-4244 ◽  
Author(s):  
Eric Finot ◽  
Eric Lesniewska ◽  
Jean-Claude Mutin ◽  
Jean-Pierre Goudonnet
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Forces ◽  
Force Microscopy ◽  
Atomic Force
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