scholarly journals Investigation of micro- and nanoscale barrier layer capacitance mechanisms of conductivity in CaCu3Ti4O12via scanning probe microscopy technique

RSC Advances ◽  
2017 ◽  
Vol 7 (65) ◽  
pp. 40695-40704 ◽  
Author(s):  
M. S. Ivanov ◽  
F. Amaral ◽  
V. A. Khomchenko ◽  
J. A. Paixão ◽  
L. C. Costa
Keyword(s):  
Dielectric Constant ◽  
Barrier Layer ◽  
Scanning Probe Microscopy ◽  
High Dielectric Constant ◽  
Scanning Probe ◽  
Ccto Ceramic ◽  
Probe Microscopy ◽  
Microscopy Technique ◽  
High Dielectric

In this work we disclose micro- and nanoscale origins of the unusually high dielectric constant characteristic of CaCu3Ti4O12 (CCTO) ceramic by using the Scanning Probe Microscopy (SPM) technique.

A novel approach to study the conductivity behavior of CaCu3Ti4O12 using scanning probe microscopy technique

2018 ◽  
Vol 8 (03) ◽  
pp. 932-937 ◽  
Author(s):  
M.S. Ivanov ◽  
F. Amaral ◽  
V.A. Khomchenko ◽  
L.C. Costa ◽  
J.A. Paixão
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Microscopy Technique ◽  
Novel Approach ◽  
Image Position ◽  
Conductivity Behavior

Abstract

Probing interlayer excitons in a vertical van der Waals p-n junction using a scanning probe microscopy technique

2019 ◽  
Vol 31 (11) ◽  
pp. 114001 ◽  
Author(s):  
Mahfujur Rahaman ◽  
Christian Wagner ◽  
Ashutosh Mukherjee ◽  
Adan Lopez-Rivera ◽  
Sibylle Gemming ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Van Der Waals ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Microscopy Technique

Processing and the Microstructure of SrTiO3-Based Bl Capacitors using Pb(Fe, W)O3 Ferroelectrics

1989 ◽  
Vol 155 ◽  
Author(s):  
Makoto Kuwabara
Keyword(s):  
Dielectric Constant ◽  
Dielectric Properties ◽  
Grain Boundaries ◽  
Strontium Titanate ◽  
Barrier Layer ◽  
High Dielectric Constant ◽  
Ferroelectric Materials ◽  
New Type ◽  
High Dielectric ◽  
Very High

ABSTRACTA preliminary experiment was conducted to prepare semiconducting strontium titanate-based internal barrier layer capacitors with ferroelectric Pb(Fe, W)O3 forming insulating layers along the grain boundaries. Processing, microstructure and the dielectric properties of this new type of BL capacitors are described. The idea to obtain this type of BL capacitors with a very high dielectric constant may be realized when the ferroelectric materials can uniformly be diffused along the grain boundaries by using a more sophisticated processing of the second firing.

scholarly journals Investigation of Grain Size Effect on the Impedance of CaCu3Ti4O12 from 100 Hz to 1 GHz of Frequency

2012 ◽  
Vol 620 ◽  
pp. 230-235 ◽  
Author(s):  
Muhammad Azwadi Sulaiman ◽  
Sabar Derita Hutagalung ◽  
Zainal Arifin Ahmad ◽  
Mohd Fadzil Ain
Keyword(s):  
Dielectric Constant ◽  
Barrier Layer ◽  
Room Temperature ◽  
High Dielectric Constant ◽  
Perovskite Phase ◽  
Wide Frequency Range ◽  
Treatment Temperature ◽  
Domain Boundaries ◽  
High Dielectric ◽  
Very High

CaCu3Ti4O12(CCTO) is a cubical perovskite phase and sintered ceramics exhibit very high dielectric constant at room temperature. The speculated origins of the high dielectric constant are the existence of insulative barrier layer at grain boundaries and domain boundaries which created an internal barrier layer capacitance (IBLC) at the microstructure of CCTO. The relation of grains and domains electrical resistance were studied in this work by using impedance spectroscopy (IS). A series of samples with different heat treatment temperature were tested to investigate their microstructure by using field emission scanning electron microscopy (FESEM). The grains and domains resistance was calculated from a wide frequency range of impedance complex plane measurement (100 Hz to 1 GHz). The FESEM and IS analyses showed the dependency of grains and domains resistance to average grains size of CCTO microstructure.

Enhanced performance of supercapacitors by constructing a “mini parallel-plate capacitor” in an electrode with high dielectric constant materials

2020 ◽  
Vol 8 (32) ◽  
pp. 16661-16668
Author(s):  
Huayao Tu ◽  
Shouzhi Wang ◽  
Hehe Jiang ◽  
Zhenyan Liang ◽  
Dong Shi ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Carbon Fiber ◽  
Parallel Plate ◽  
Sandwich Structure ◽  
High Dielectric Constant ◽  
Parallel Plate Capacitor ◽  
Plate Capacitor ◽  
Fiber Metal ◽  
High Dielectric ◽  
Mini Plate

The carbon fiber/metal oxide/metal oxynitride layer sandwich structure is constructed in the electrode to form a mini-plate capacitor. High dielectric constant metal oxides act as dielectric to increase their capacitance.

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