Accelerated atomic-scale exploration of phase evolution in compositionally complex materials
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Combining nanoscale-tip arrays with combinatorial thin film deposition and processing as well as direct atomic-scale characterization (APT and TEM) enables accelerated exploration of the temperature- and environment-dependent phase evolution in multinary materials systems.
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1991 ◽
Vol 49
◽
pp. 1068-1069
1988 ◽
Vol 46
◽
pp. 866-867
2001 ◽
Vol 11
(PR3)
◽
pp. Pr3-553-Pr3-560
◽
2020 ◽
Vol 31
(9)
◽
pp. 6948-6955
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