Depth profiling of nanometer thin layers by laser desorption and laser postionization time-of-flight mass spectrometry

2017 ◽  
Vol 32 (10) ◽  
pp. 1878-1884 ◽  
Author(s):  
Zhibin Yin ◽  
Xiaoling Cheng ◽  
Rong Liu ◽  
Wei Hang ◽  
Benli Huang
Keyword(s):  
Mass Spectrometry ◽  
Mass Spectrometer ◽  
Time Of Flight ◽  
Depth Profiling ◽  
Laser Desorption ◽  
Thin Layers ◽  
Flight Mass Spectrometer ◽  
Flight Mass Spectrometry

A laser desorption and laser postionization time-of-flight mass spectrometer was employed for the depth profiling of nanometer thin-layers.

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