Evaluation of microchannel plate gain drops caused by high ion fluxes in time‐of‐flight mass spectrometry: A novel evaluation method using a multi‐turn time‐of‐flight mass spectrometer

2021 ◽  
Vol 56 (3) ◽  
Author(s):  
Hiroshi Kobayashi ◽  
Toshinobu Hondo ◽  
Michisato Toyoda
Keyword(s):  
Mass Spectrometry ◽  
Mass Spectrometer ◽  
Evaluation Method ◽  
Time Of Flight ◽  
Microchannel Plate ◽  
Ion Fluxes ◽  
Flight Mass Spectrometer ◽  
Flight Mass Spectrometry

Depth profiling of nanometer thin layers by laser desorption and laser postionization time-of-flight mass spectrometry

2017 ◽  
Vol 32 (10) ◽  
pp. 1878-1884 ◽  
Author(s):  
Zhibin Yin ◽  
Xiaoling Cheng ◽  
Rong Liu ◽  
Wei Hang ◽  
Benli Huang
Keyword(s):  
Mass Spectrometry ◽  
Mass Spectrometer ◽  
Time Of Flight ◽  
Depth Profiling ◽  
Laser Desorption ◽  
Thin Layers ◽  
Flight Mass Spectrometer ◽  
Flight Mass Spectrometry

A laser desorption and laser postionization time-of-flight mass spectrometer was employed for the depth profiling of nanometer thin-layers.

Secondary ion mass spectrometry of protected diribonucleoside monophosphates with a time-of-flight mass spectrometer

1982 ◽  
Vol 54 (6) ◽  
pp. 960-966 ◽  
Author(s):  
Werner. Ens ◽  
Kenneth G. Standing ◽  
John B. Westmore ◽  
Kelvin K. Ogilvie ◽  
Mona J. Nemer
Keyword(s):  
Mass Spectrometry ◽  
Mass Spectrometer ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Flight Mass Spectrometer ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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