Tip-enhanced Raman spectroscopy – from early developments to recent advances

2017 ◽  
Vol 46 (13) ◽  
pp. 4077-4110 ◽  
Author(s):  
Tanja Deckert-Gaudig ◽  
Atsushi Taguchi ◽  
Satoshi Kawata ◽  
Volker Deckert
Keyword(s):  
Raman Spectroscopy ◽  
Current Status ◽  
Experimental Conditions ◽  
Analytical Technique ◽  
Recent Advances ◽  
Tip Enhanced Raman Spectroscopy

An analytical technique operating at the nanoscale must be flexible regarding variable experimental conditions while ideally also being highly specific, extremely sensitive, and spatially confined. TERS has the potential to address all these items and its current status will be thoroughly discussed.

Recent Advances in Tip-Enhanced Raman Spectroscopy

2014 ◽  
Vol 5 (18) ◽  
pp. 3125-3130 ◽  
Author(s):  
Matthew D. Sonntag ◽  
Eric A. Pozzi ◽  
Nan Jiang ◽  
Mark C. Hersam ◽  
Richard P. Van Duyne
Keyword(s):  
Raman Spectroscopy ◽  
Recent Advances ◽  
Tip Enhanced Raman Spectroscopy

Damage-free tip-enhanced Raman spectroscopy for heat-sensitive materials

Nanoscale ◽  
2017 ◽  
Vol 9 (30) ◽  
pp. 10715-10720 ◽  
Author(s):  
Masahito Mochizuki ◽  
Ganchimeg Lkhamsuren ◽  
Kasinan Suthiwanich ◽  
Evan Angelo Mondarte ◽  
Taka-aki Yano ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Mechanical Damage ◽  
Experimental Conditions ◽  
Tip Enhanced Raman Spectroscopy

We report a method to establish experimental conditions for tip-enhanced Raman spectroscopy (TERS) with low thermal and mechanical damage to samples.

Surface-and tip-enhanced Raman spectroscopy of silicon

2008 ◽  
Author(s):  
K. J. Yi ◽  
X. N. He ◽  
W. Q. Yang ◽  
Y. S. Zhou ◽  
W. Xiong ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Tip Enhanced Raman Spectroscopy

Capability of tip-enhanced Raman spectroscopy about nanoscale analysis of strained silicon for semiconductor devices production

2017 ◽  
Vol 110 (10) ◽  
pp. 103105 ◽  
Author(s):  
Arianna Lucia ◽  
Onofrio Antonino Cacioppo ◽  
Enrico Iulianella ◽  
Luca Latessa ◽  
Giuseppe Moccia ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Semiconductor Devices ◽  
Strained Silicon ◽  
Tip Enhanced Raman Spectroscopy
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